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Oxidation suppression in ytterbium silicidation by TiTiN bicapping layer

  • Yu Long Jiang*
  • , Qi Xie
  • , Christophe Detavernier
  • , R. L. Van Meirhaeghe
  • , Guo Ping Ru
  • , Xin Ping Qu
  • , Bing Zong Li
  • , Anping Huang
  • , Paul K. Chu
  • *Corresponding author for this work
  • Fudan University
  • Ghent University
  • City University of Hong Kong

Research output: Contribution to journalArticlepeer-review

Abstract

Ytterbium (Yb) silicide is a promising contact material due to its low contact resistance and small Schottky barrier height in contact with n -type Si. However, as one of the rare earth metals, Yb is easily oxidized during physical vapor deposition and rapid thermal annealing. In this article, a bilayered TiTiN cap is proposed and demonstrated to effectively suppress oxidation during Yb silicidation. The authors' results reveal that diffusion of Ti atoms in the TiN layer plays a key role in oxidation suppression.

Original languageEnglish
Pages (from-to)285-289
Number of pages5
JournalJournal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
Volume25
Issue number2
DOIs
StatePublished - 2007
Externally publishedYes

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