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Oriented AlN films prepared with solid AlCl3 source by bias assisted Cat-CVD

  • A. P. Huang
  • , G. J. Wang
  • , S. L. Xu
  • , M. K. Zhu
  • , G. H. Li
  • , B. Wang*
  • , H. Yan
  • *Corresponding author for this work
  • Beijing University of Technology
  • Liaocheng University

Research output: Contribution to journalArticlepeer-review

Abstract

In this paper, aluminum nitride (AlN) films have been successfully synthesized by taking solid AlCl3 as the source of atomic aluminum, with negative bias assisted catalytic chemical vapor deposition (Cat-CVD) on Si(100) substrate at low temperatures. Nitrogen (N2) and hydrogen (H2) were used as gas precursors. The results show that by using AlCl3 as the aluminum source AlN films with preferential orientation can be obtained under negative bias assistance by Cat-CVD. The effects of the bias during the deposition process are discussed in details.

Original languageEnglish
Pages (from-to)161-165
Number of pages5
JournalMaterials Science and Engineering: B
Volume107
Issue number2
DOIs
StatePublished - 15 Mar 2004
Externally publishedYes

Keywords

  • AlN
  • Cat-CVD
  • Orientation
  • Substrate bias

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