TY - GEN
T1 - Optimum test point selection based on MADM for analog fault dictionary techniques
AU - Chen, Xiao Mei
AU - Meng, Xiao Feng
AU - Wang, Guo Hua
PY - 2011
Y1 - 2011
N2 - a new graph-search algorithm based on multi-attribute decision making (MADM) is proposed. Firstly, A* algorithm is used for graph-search, but when cost functions f(x) of two nodes are equal, three attributes describing a node are introduced. Secondly, a multi-attribute decision based on maximum deviation principle is used for nodes evaluation in order to select the best node for expanding. The proposed algorithm could overcome deviation brought by node evaluation based on information theory metrics only, which results in high accuracy. The outcome of simulation verification at the end of this paper manifests that this algorithm has excellent accuracy as the exhaustive algorithm, and is more quickly for large scale computation.
AB - a new graph-search algorithm based on multi-attribute decision making (MADM) is proposed. Firstly, A* algorithm is used for graph-search, but when cost functions f(x) of two nodes are equal, three attributes describing a node are introduced. Secondly, a multi-attribute decision based on maximum deviation principle is used for nodes evaluation in order to select the best node for expanding. The proposed algorithm could overcome deviation brought by node evaluation based on information theory metrics only, which results in high accuracy. The outcome of simulation verification at the end of this paper manifests that this algorithm has excellent accuracy as the exhaustive algorithm, and is more quickly for large scale computation.
KW - Fault dictionary
KW - Mutli-attribute decision making(MADM)
KW - Test point selection
UR - https://www.scopus.com/pages/publications/79951639523
U2 - 10.4028/www.scientific.net/AMM.48-49.807
DO - 10.4028/www.scientific.net/AMM.48-49.807
M3 - 会议稿件
AN - SCOPUS:79951639523
SN - 9783037850190
T3 - Applied Mechanics and Materials
SP - 807
EP - 812
BT - Measuring Technology and Mechatronics Automation
T2 - 3rd International Conference on Measuring Technology and Mechatronics Automation, ICMTMA 2011
Y2 - 6 January 2011 through 7 January 2011
ER -