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Optimization of large-aperture optics clean assembly method

  • Kai Long*
  • , Guoqing Pei
  • , Congzhi Yi
  • , Zheng Zhang
  • , Hui Wang
  • *Corresponding author for this work
  • Tsinghua University
  • China Academy of Engineering Physics

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

The contamination on optical surface is an important factor that causes laser-induced damage. In the assembly process of the SGIII, the traditional manual assembly method poses a great challenge in terms of the cleanliness of optical components. So the contamination introduced by the manual assembly is studied including particulate and non-volatile residue (NVR). The use of vacuum system device to clamp is an important means to achieve automated clean assembly. The contact contamination is the main source of contaminants in the vacuum-clamping process. One source is the organic residue left on the optical surface, by comparing the residue of different sealing rubber after absorbing the optics, we find that FPM (fluorine rubber) brings the least contamination. The second source is the coating debris causing by the compressive and shear stress on the optical surface during the vacuum clamping process. We have established a theoretical model, through the numerical simulation method to obtain the stress under different assembly conditions. For different optical films, the stress during the assembly process cannot exceed the fatigue limit of the optical coating to prevent the film from being destroyed and debris contamination. The cleanliness level of the vacuum clamp assembly process is evaluated through experiments. The results show that the contamination generated by assembling large-aperture optics with a vacuum gripper meets the optical surface cleanliness requirements.

Original languageEnglish
Title of host publicationOptical Precision Manufacturing, Testing, and Applications
EditorsJohn W. McBride, Xuejun Zhang, Sen Han, JiuBin Tan
PublisherSPIE
ISBN (Electronic)9781510623361
DOIs
StatePublished - 2018
Externally publishedYes
EventInternational Symposium on Optoelectronic Technology and Application 2018: Optical Precision Manufacturing, Testing, and Applications, OTA 2018 - Beijing, China
Duration: 22 May 201824 May 2018

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume10847
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Conference

ConferenceInternational Symposium on Optoelectronic Technology and Application 2018: Optical Precision Manufacturing, Testing, and Applications, OTA 2018
Country/TerritoryChina
CityBeijing
Period22/05/1824/05/18

Keywords

  • Contact contamination
  • assembly method
  • cleanliness
  • optics

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