Optical transient waveform monitoring based on cross-gain modulation in semiconductor optical amplifier

Yi Yang; Zhong yin Xiao; Jian sheng Liu; Guan jun Wang

doi:10.1007/s11801-012-1141-0

Optical transient waveform monitoring based on cross-gain modulation in semiconductor optical amplifier

Yi Yang^*
, Zhong yin Xiao
, Jian sheng Liu
, Guan jun Wang

^*Corresponding author for this work

School of Electronic and Information Engineering

Shanghai University
Donghua University
Beihang University

Research output: Contribution to journal › Article › peer-review

Abstract

An all-optical transient waveform equivalent time sampling system based on cross-gain modulation (XGM) in semiconductor optical amplifier (SOA) is presented. A noisy SOA dynamic model and PIN equivalent circuit function are employed for system evaluating. The results show this SOA-XGM sampler with subtracting postprocessing can achieve picosecond sampling window. The shape of sampling window can be adjusted by SOA bias current and amplitude of control pulse. Compared with amplified spontaneous emission (ASE) noise of SOA and thermal noise in PIN, the jitter of sampling control pulse causes most sampling error. Simulations show that this SOA-XGM sampler can be a capable candidate for transient waveform sampling.

Original language	English
Pages (from-to)	40-42
Number of pages	3
Journal	Optoelectronics Letters
Volume	8
Issue number	1
DOIs	https://doi.org/10.1007/s11801-012-1141-0
State	Published - Jan 2012

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title = "Optical transient waveform monitoring based on cross-gain modulation in semiconductor optical amplifier",

abstract = "An all-optical transient waveform equivalent time sampling system based on cross-gain modulation (XGM) in semiconductor optical amplifier (SOA) is presented. A noisy SOA dynamic model and PIN equivalent circuit function are employed for system evaluating. The results show this SOA-XGM sampler with subtracting postprocessing can achieve picosecond sampling window. The shape of sampling window can be adjusted by SOA bias current and amplitude of control pulse. Compared with amplified spontaneous emission (ASE) noise of SOA and thermal noise in PIN, the jitter of sampling control pulse causes most sampling error. Simulations show that this SOA-XGM sampler can be a capable candidate for transient waveform sampling.",

author = "Yi Yang and Xiao, \{Zhong yin\} and Liu, \{Jian sheng\} and Wang, \{Guan jun\}",

year = "2012",

month = jan,

doi = "10.1007/s11801-012-1141-0",

language = "英语",

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journal = "Optoelectronics Letters",

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AU - Yang, Yi

AU - Xiao, Zhong yin

AU - Liu, Jian sheng

AU - Wang, Guan jun

PY - 2012/1

Y1 - 2012/1

N2 - An all-optical transient waveform equivalent time sampling system based on cross-gain modulation (XGM) in semiconductor optical amplifier (SOA) is presented. A noisy SOA dynamic model and PIN equivalent circuit function are employed for system evaluating. The results show this SOA-XGM sampler with subtracting postprocessing can achieve picosecond sampling window. The shape of sampling window can be adjusted by SOA bias current and amplitude of control pulse. Compared with amplified spontaneous emission (ASE) noise of SOA and thermal noise in PIN, the jitter of sampling control pulse causes most sampling error. Simulations show that this SOA-XGM sampler can be a capable candidate for transient waveform sampling.

AB - An all-optical transient waveform equivalent time sampling system based on cross-gain modulation (XGM) in semiconductor optical amplifier (SOA) is presented. A noisy SOA dynamic model and PIN equivalent circuit function are employed for system evaluating. The results show this SOA-XGM sampler with subtracting postprocessing can achieve picosecond sampling window. The shape of sampling window can be adjusted by SOA bias current and amplitude of control pulse. Compared with amplified spontaneous emission (ASE) noise of SOA and thermal noise in PIN, the jitter of sampling control pulse causes most sampling error. Simulations show that this SOA-XGM sampler can be a capable candidate for transient waveform sampling.

UR - https://www.scopus.com/pages/publications/84863293685

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VL - 8

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JF - Optoelectronics Letters

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ER -

Optical transient waveform monitoring based on cross-gain modulation in semiconductor optical amplifier

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