Optical metrology embraces deep learning: keeping an open mind

Bing Pan

doi:10.1038/s41377-022-00829-1

Optical metrology embraces deep learning: keeping an open mind

Bing Pan^*

^*Corresponding author for this work

School of Aeronautic Science and Engineering

Research output: Contribution to journal › Article › peer-review

5 Scopus citations

Abstract

Optical metrology practitioners ought to embrace deep learning with an open mind, while devote continuing efforts to look for its theoretical groundwork and maintain an awareness of its limits.

Original language	English
Article number	139
Journal	Light: Science and Applications
Volume	11
Issue number	1
DOIs	https://doi.org/10.1038/s41377-022-00829-1
State	Published - Dec 2022

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title = "Optical metrology embraces deep learning: keeping an open mind",

abstract = "Optical metrology practitioners ought to embrace deep learning with an open mind, while devote continuing efforts to look for its theoretical groundwork and maintain an awareness of its limits.",

author = "Bing Pan",

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AB - Optical metrology practitioners ought to embrace deep learning with an open mind, while devote continuing efforts to look for its theoretical groundwork and maintain an awareness of its limits.

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Optical metrology embraces deep learning: keeping an open mind

Abstract

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