TY - GEN
T1 - On Statistical Distribution of Far-Field Electric Field for the Diagnosis of Faulty Element
AU - Zhao, Yunru
AU - Wu, Qi
N1 - Publisher Copyright:
© 2024 IEEE.
PY - 2024
Y1 - 2024
N2 - The presence of faulty elements deteriorates the performance of a phased array, e.g., beam pointing errors, gain degradation, sidelobe deterioration. It is desirable to locate the faulty elements without performing a dedicated procedure. In this work, we present an un-cooperated testing method by placing a testing antenna in the far-field region of the phased array. The electric field of the phased array during beam scanning is measured at fixed locations. Statistical distributions of the electric field yield an interesting phenomenon that the curves are orderly distributed if an array element does not work. This method may provide a potential solution for the diagnosis of faulty elements.
AB - The presence of faulty elements deteriorates the performance of a phased array, e.g., beam pointing errors, gain degradation, sidelobe deterioration. It is desirable to locate the faulty elements without performing a dedicated procedure. In this work, we present an un-cooperated testing method by placing a testing antenna in the far-field region of the phased array. The electric field of the phased array during beam scanning is measured at fixed locations. Statistical distributions of the electric field yield an interesting phenomenon that the curves are orderly distributed if an array element does not work. This method may provide a potential solution for the diagnosis of faulty elements.
KW - faulty elements diagnosis
KW - sequentiality
KW - statistical characteristics
UR - https://www.scopus.com/pages/publications/105005827153
U2 - 10.1109/CAMA62287.2024.10986223
DO - 10.1109/CAMA62287.2024.10986223
M3 - 会议稿件
AN - SCOPUS:105005827153
T3 - IEEE Conference on Antenna Measurements and Applications, CAMA
BT - 2024 IEEE Conference on Antenna Measurements and Applications, CAMA 2024
PB - Institute of Electrical and Electronics Engineers
T2 - 2024 IEEE Conference on Antenna Measurements and Applications, CAMA 2024
Y2 - 9 October 2024 through 11 October 2024
ER -