Normal Distribution Sampling Convolutional Neural Network for Fine-Grained Image Classification

  • Feng Liu*
  • , Shuling Dai
  • *Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

In this paper, we propose a Normal distribution Sampling Convolutional Neural Network (NS-CNN) for Fine-grained Image Classification. Different from other fine-grained classification networks, which directly use the discriminative feature area for classification, NS-CNN centers on the discriminative feature area, and uses the probability model based on the two-dimensional normal distribution to resample the image pixels, and then recognizes the new image. This method can focus on the discriminative feature area and consider the influence of the surrounding areas of the discriminative feature. At the stage of classification, NS-CNN divides the image into several grids, and each grid is classified as a discriminative feature area. And finally, all the classification results are merged to get the final result. This method omits the complex discriminative feature localization network, so the network parameters are fewer. This helps enable fine-grained classification networks to work on computers with common hardware. We tested this method on CUB-200-2011 dataset, and the experimental result show that NS-CNN can get an outstanding performance on fine-grained classification with a lightweight network architecture.

Original languageEnglish
Title of host publicationProceedings of 2019 Chinese Intelligent Systems Conference - Volume III
EditorsYingmin Jia, Junping Du, Weicun Zhang
PublisherSpringer Verlag
Pages645-652
Number of pages8
ISBN (Print)9789813296978
DOIs
StatePublished - 2020
EventChinese Intelligent Systems Conference, CISC 2019 - Haikou, China
Duration: 26 Oct 201927 Oct 2019

Publication series

NameLecture Notes in Electrical Engineering
Volume594
ISSN (Print)1876-1100
ISSN (Electronic)1876-1119

Conference

ConferenceChinese Intelligent Systems Conference, CISC 2019
Country/TerritoryChina
CityHaikou
Period26/10/1927/10/19

Keywords

  • Discriminative feature
  • Fine-grained image classification
  • Normal distribution

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