Abstract
Traditional test methods of embedded system software impose on the object system and the test results are not accurate enough as expected. Non-interference test (NIT) method can solve the problem. NIT is completely of non-interference to the object software. By analyzing the basic characteristics of NIT, an application model of NIT was set up. There must be three modules in this model, including static analytical module, dynamic analytical module and data gathering subsystem which tracks the object system by hardware. Static analytical module gives the static characteristics of the object software and tells the other two modulus how to gather the state data of the object system and how to understand the data. In all steps of the test cycle, NIT does not need any instruction executed within the test round into the object program.
| Original language | English |
|---|---|
| Pages (from-to) | 666-669 |
| Number of pages | 4 |
| Journal | Beijing Hangkong Hangtian Daxue Xuebao/Journal of Beijing University of Aeronautics and Astronautics |
| Volume | 30 |
| Issue number | 7 |
| State | Published - Jul 2004 |
Keywords
- Data acquisition
- Embedded system
- Software
- Software test
- White box test
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