@inproceedings{5f8e9192edd54059b4496ef7a3a607c5,
title = "Noise Analysis of Readout Chain in FDSOI-based 1T-APS for In-Sensor Vector-Matrix-Multiplication",
abstract = "A noise analysis scheme for readout chain of Fully-Depleted Silicon-on-Insulator (FDSOI) based one transistor active pixel sensor (1T-APS) has been proposed. Both shot noise and read noise in pixel and the transfer function of column level circuit are modelled and calibrated to describe the signal-to-noise (SNR) behavior. The SNR behavior with gate length decreasing is predicted (Peak SNR 39.8 dB @ L 60nm). The noise analysis enables accuracy recovery for in-sensor VMM assisted deep learning through noise participating in hardware-aware training and shows little deviation from baseline (<0.5\% for Cifar-10 @ VGG11).",
keywords = "FDSOI, Hardware-Aware Training, In-sensor Computing, Noise, Readout Chain",
author = "Y. Xiao and Z. Zhou and Y. Wang and J. Li and G. Yu and S. Li and H. Yang and L. Han and R. Chen and X. Liu and J. Kang and P. Huang",
note = "Publisher Copyright: {\textcopyright} 2024 IEEE.; 8th IEEE Electron Devices Technology and Manufacturing Conference, EDTM 2024 ; Conference date: 03-03-2024 Through 06-03-2024",
year = "2024",
doi = "10.1109/EDTM58488.2024.10512110",
language = "英语",
series = "IEEE Electron Devices Technology and Manufacturing Conference: Strengthening the Globalization in Semiconductors, EDTM 2024",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
booktitle = "IEEE Electron Devices Technology and Manufacturing Conference",
address = "美国",
}