Skip to main navigation Skip to search Skip to main content

N-scroll chaotic attractors from a general jerk circuit

  • Simin Yu*
  • , Jinhu Lü
  • , Henry Leung
  • , Guanrong Chen
  • *Corresponding author for this work
  • Guangdong University of Technology
  • CAS - Academy of Mathematics and System Sciences
  • University of Calgary
  • City University of Hong Kong

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

This paper proposes a novel nonlinear modulating function approach for generating n-scroll chaotic attractors based on a general jerk circuit. The systematic nonlinear modulating function methodology developed here can arbitrarily design the swings, widths, slopes, breakpoints, equilibrium points, and shapes of the n-scroll chaotic attractors via the adjustable sawtooth wave, triangular wave, and transconductor wave functions. A block circuit diagram is designed for hardware implementation of various 3 ̃ 12-scroll attractors via switchings of the switch linkages. This is the first time to experimentally verify a 12-scroll chaotic attractor generated by an analog circuit under the laboratory environment.

Original languageEnglish
Title of host publicationProceedings - IEEE International Symposium on Circuits and Systems 2005, ISCAS 2005
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages1473-1476
Number of pages4
ISBN (Print)9780780388345
DOIs
StatePublished - 2005
Externally publishedYes
Event2005 IEEE International Symposium on Circuits and Systems, ISCAS 2005 - Kobe, Japan
Duration: 23 May 2005 → 26 May 2005

Publication series

NameProceedings - IEEE International Symposium on Circuits and Systems
ISSN (Print)0271-4310

Conference

Conference2005 IEEE International Symposium on Circuits and Systems, ISCAS 2005
Country/TerritoryJapan
CityKobe
Period23/05/05 → 26/05/05

Fingerprint

Dive into the research topics of 'N-scroll chaotic attractors from a general jerk circuit'. Together they form a unique fingerprint.

Cite this