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MURE: Making Use of MUtations to REfine Spectrum-Based Fault Localization

  • Zijie Li
  • , Lanfei Yan
  • , Yuzhen Liu
  • , Zhenyu Zhang*
  • , Bo Jiang
  • *Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Locating faults in programs is never an easy task. Spectrum-based fault localization (SBFL) techniques estimate suspicious statements by contrasting the coverage spectra collected from passed and failed program runs. Mutation-based such techniques locate faults by trying different mutates with the aim of finding one that involves less turbulence to program behavior. The latter is empirically known more accurate, but with massive increases in time complexity. In this paper, we propose a new approach, MURE, which uses methodology of the latter to refine results of the former. MURE first drives a stateor-the-art SBFL technique Naish2 to output a list of suspicious statements. It then picks out suspicious statement as candidates, generates mutates for them, and estimates their likelihood of relating to faults. Finally, it refines the resultant list by adjusting part of its ordering. An experiment validates its effectiveness by showing a 30% accuracy improvement over Naish2.

Original languageEnglish
Title of host publicationProceedings - 2018 IEEE 18th International Conference on Software Quality, Reliability, and Security Companion, QRS-C 2018
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages56-63
Number of pages8
ISBN (Print)9781538678398
DOIs
StatePublished - 9 Aug 2018
Event18th IEEE International Conference on Software Quality, Reliability, and Security Companion, QRS-C 2018 - Lisbon, Portugal
Duration: 16 Jul 201820 Jul 2018

Publication series

NameProceedings - 2018 IEEE 18th International Conference on Software Quality, Reliability, and Security Companion, QRS-C 2018

Conference

Conference18th IEEE International Conference on Software Quality, Reliability, and Security Companion, QRS-C 2018
Country/TerritoryPortugal
CityLisbon
Period16/07/1820/07/18

Keywords

  • Fault localization
  • Mutation testing
  • Software debugging

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