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Multi-View Geometric Mean Metric Learning for Kinship Verification

  • Beijing University of Chemical Technology
  • Tsinghua University
  • National University of Defense Technology

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

This paper proposes a multi-view geometric mean metric learning (MvGMML) method for the real-world kinship verification from facial images. Unlike existing kinship verification methods which dramatically degrade their performance when facial images are not well aligned, we present an efficient misalignment-robust kinship verification framework. First, a facial feature detector is employed to localize several facial feature points such as the right and left corners of two eyes. Then, a dense SIFT descriptor is extracted around each feature point. Lastly, our proposed MvGMML method jointly learns multiple local geometric mean metrics, one geometric mean metric for each view (i.e., feature point), to better exploit complementary information of all views. Experimental results on two widely used kinship datasets are presented to show the efficacy of our method.

Original languageEnglish
Title of host publication2019 IEEE International Conference on Image Processing, ICIP 2019 - Proceedings
PublisherIEEE Computer Society
Pages1178-1182
Number of pages5
ISBN (Electronic)9781538662496
DOIs
StatePublished - Sep 2019
Externally publishedYes
Event26th IEEE International Conference on Image Processing, ICIP 2019 - Taipei, Taiwan, Province of China
Duration: 22 Sep 201925 Sep 2019

Publication series

NameProceedings - International Conference on Image Processing, ICIP
Volume2019-September
ISSN (Print)1522-4880

Conference

Conference26th IEEE International Conference on Image Processing, ICIP 2019
Country/TerritoryTaiwan, Province of China
CityTaipei
Period22/09/1925/09/19

Keywords

  • Metric learning
  • geometric mean metric
  • kinship verification
  • multi-view learning

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