Monocular Depth Estimation: A Survey

  • Dong Wang
  • , Zhong Liu
  • , Shuwei Shao
  • , Xingming Wu
  • , Weihai Chen*
  • , Zhengguo Li
  • *Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Monocular depth estimation is an ill-posed task in computer vision, which holds great significance in the fields such as artificial intelligence, virtual reality, augmented reality, path planning, unmanned driving, and navigation guidance. The primary objective of monocular depth estimation is to predict the depth value of each pixel or infer depth information, given just a single red-green-blue (RGB) image as input. Traditional monocular depth estimation methods rely on limited depth cues, such as strict scene conditions. With the significant advancements in computer vision and artificial intelligence, monocular depth estimation using deep learning has been extensively researched and has yielded substantial results. This paper presents a comprehensive survey of monocular depth estimation. Firstly, we give an overall introduction to monocular depth estimation and explain it from traditional and deep learning-based methods, respectively. To specify, supervised, self-supervised and semi-supervised models are described in detail in deep learning-based methods. Additionally, we introduce publicly available benchmark datasets and evaluation metrics commonly used in this field. Finally, we discuss the current challenges and promising prospects for the development of monocular depth estimation.

Original languageEnglish
Title of host publicationIECON 2023 - 49th Annual Conference of the IEEE Industrial Electronics Society
PublisherIEEE Computer Society
ISBN (Electronic)9798350331820
DOIs
StatePublished - 2023
Event49th Annual Conference of the IEEE Industrial Electronics Society, IECON 2023 - Singapore, Singapore
Duration: 16 Oct 202319 Oct 2023

Publication series

NameIECON Proceedings (Industrial Electronics Conference)
ISSN (Print)2162-4704
ISSN (Electronic)2577-1647

Conference

Conference49th Annual Conference of the IEEE Industrial Electronics Society, IECON 2023
Country/TerritorySingapore
CitySingapore
Period16/10/2319/10/23

Keywords

  • Deep learning
  • Monocular depth estimation
  • Self-supervised model
  • Semi-supervised model
  • Supervised model

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