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Moiré superlattice modulations in single-unit-cell FeTe films grown on NbSe2single crystals

  • Han Bin Deng
  • , Yuan Li
  • , Zili Feng
  • , Jian Yu Guan
  • , Xin Yu
  • , Xiong Huang
  • , Rui Zhe Liu
  • , Chang Jiang Zhu
  • , Limin Liu
  • , Ying Kai Sun
  • , Xi Liang Peng
  • , Shuai Shuai Li
  • , Xin Du
  • , Zheng Wang
  • , Rui Wu
  • , Jia Xin Yin
  • , You Guo Shi
  • , Han Qing Mao*
  • *Corresponding author for this work
  • CAS - Institute of Physics
  • University of Chinese Academy of Sciences
  • Songshan Lake Materials Laboratory
  • Princeton University

Research output: Contribution to journalArticlepeer-review

Abstract

Interface can be a fertile ground for exotic quantum states, including topological superconductivity, Majorana mode, fractal quantum Hall effect, unconventional superconductivity, Mott insulator, etc. Here we grow single-unit-cell (1UC) FeTe film on NbSe2 single crystal by molecular beam epitaxy (MBE) and investigate the film in-situ with a home-made cryogenic scanning tunneling microscopy (STM) and non-contact atomic force microscopy (AFM) combined system. We find different stripe-like superlattice modulations on grown FeTe film with different misorientation angles with respect to NbSe2 substrate. We show that these stripe-like superlattice modulations can be understood as moiré pattern forming between FeTe film and NbSe2 substrate. Our results indicate that the interface between FeTe and NbSe2 is atomically sharp. By STM-AFM combined measurement, we suggest that the moiré superlattice modulations have an electronic origin when the misorientation angle is relatively small (≤ 3 ) and have structural relaxation when the misorientation angle is relatively large (≥ 10 ).

Original languageEnglish
Article number126801
JournalChinese Physics B
Volume30
Issue number12
DOIs
StatePublished - Dec 2021
Externally publishedYes

Keywords

  • FeTe film
  • atomic force microscopy (AFM)
  • misorientation
  • moir e superlattice
  • scanning tunneling microscopy (STM)

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