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Modeling of MEMS gyro drift based on wavelet threshold denoising and improved Elman neural network

  • Beihang University

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Low signal-noise-ratio (SNR) of micro-electro-mechanical system (MEMS) gyro has directly restricted the accuracy and practical application of MEMS inertial measurement unit (MIMU). Aiming at diminishing accumulative errors resulted from inherent drift, a MEMS gyro drift modeling method based on wavelet threshold denoising and improved Elman neural network is proposed in this paper. To observe noise characteristics, gyro signals are first processed by Allan variance analysis. The wavelet threshold denoising algorithm is employed to separate random drift and high-frequency white noise. Due to the nonstationary and time-varying characteristics of drift error, an improved Elman neural network is designed for drift modeling and compensation. Experimental results demonstrate that the proposed method achieves high-precision drift modeling and has superior performance compared with traditional time series analysis.

Original languageEnglish
Title of host publication2019 14th IEEE International Conference on Electronic Measurement and Instruments, ICEMI 2019
EditorsJuan Wu, Jiali Yin, Zhang Qi
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages1754-1761
Number of pages8
ISBN (Electronic)9781728105093
DOIs
StatePublished - Nov 2019
Event14th IEEE International Conference on Electronic Measurement and Instruments, ICEMI 2019 - Changsha, China
Duration: 1 Nov 20193 Nov 2019

Publication series

Name2019 14th IEEE International Conference on Electronic Measurement and Instruments, ICEMI 2019

Conference

Conference14th IEEE International Conference on Electronic Measurement and Instruments, ICEMI 2019
Country/TerritoryChina
CityChangsha
Period1/11/193/11/19

Keywords

  • Allan variance.
  • Elman neural network
  • MEMS gyro
  • random drift
  • wavelet threshold denoising

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