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Modeling and Measurement of Electromagnetic Susceptibility Transfer for LDO Chips

  • Jingxuan Chen
  • , Guangzhi Chen*
  • , Hongzhan Song
  • , Zhenhua Wen
  • , Youlong Weng
  • , Donglin Su
  • *Corresponding author for this work
  • Beihang University

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Electromagnetic susceptibility (EMS) modeling of integrated circuits (ICs) is crucial to ensure the electromagnetic compatibility (EMC) of electronic systems. In complex circuits, the EMS response of ICs is modified by transfer effects introduced by peripheral circuitry, which leads to discrepancies between modeled and observed susceptibility. This article proposes a modeling approach to characterize the EMS transfer behavior of low dropout regulators (LDO). The proposed method enables the prediction of the EMS threshold of LDO chips with peripheral circuitry based on standalone chip-level EMS models. Experiments are conducted to demonstrate the effectiveness of the proposed method and confirm the accuracy of the EMS threshold predictions after considering transfer effects.

Original languageEnglish
Title of host publicationAPMC 2025 - 2025 Asia-Pacific Microwave Conference
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9798331534554
DOIs
StatePublished - 2025
Event2025 Asia-Pacific Microwave Conference, APMC 2025 - Jeju Island, Korea, Republic of
Duration: 2 Dec 20255 Dec 2025

Publication series

NameAsia-Pacific Microwave Conference Proceedings, APMC
ISSN (Electronic)2690-3946

Conference

Conference2025 Asia-Pacific Microwave Conference, APMC 2025
Country/TerritoryKorea, Republic of
CityJeju Island
Period2/12/255/12/25

Keywords

  • Electromagnetic susceptibility (EMS) transfer
  • integrated circuit (IC)
  • passive distribution network (PDN)
  • threshold prediction

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