Skip to main navigation Skip to search Skip to main content

Modeling and analysis of failure mechanism dependence based on petri net

  • Beihang University

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Reliability analysis based on failure mechanism takes advantage of unnecessary requirement for the field data, compared with the traditional method based on probability statistics. Current reliability analysis for systems based on failure dependence mainly focus their views on either failure level or failure process level, but barely from the aspect of failure mechanism. Our previous work used Mechanism Failure Tree (MFT) to show the correlation of failure mechanisms directly, but it is unavailable to express the dynamic flow of failure states. This paper proposed a modeling method of dependence of failure mechanism based on Petri net for electronic systems. Compared with MFT, the dynamic characteristics of failure mechanisms can be indicated effectively. In this paper, the models based on Petri net of four basic dependence of failure mechanisms which is utilized to generate the Petri net model of dependence of failure mechanism for a practical system have been given. And a case of a simple electronic system has been studied in the final part in order to illuminate the process of modeling.

Original languageEnglish
Title of host publicationProceedings of 2016 Prognostics and System Health Management Conference, PHM-Chengdu 2016
EditorsQiang Miao, Zhaojun Li, Ming J. Zuo, Liudong Xing, Zhigang Tian
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781509027781
DOIs
StatePublished - 16 Jan 2017
Event7th IEEE Prognostics and System Health Management Conference, PHM-Chengdu 2016 - Chengdu, Sichuan, China
Duration: 19 Oct 201621 Oct 2016

Publication series

NameProceedings of 2016 Prognostics and System Health Management Conference, PHM-Chengdu 2016

Conference

Conference7th IEEE Prognostics and System Health Management Conference, PHM-Chengdu 2016
Country/TerritoryChina
CityChengdu, Sichuan
Period19/10/1621/10/16

Keywords

  • Dependence of failure mechanism
  • Electronic systems
  • Petri net
  • Reliability analysis

Fingerprint

Dive into the research topics of 'Modeling and analysis of failure mechanism dependence based on petri net'. Together they form a unique fingerprint.

Cite this