Mission reliability prediction methods for board-level electronic equipment based on physics of failure and Bayesian networks

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Compared with the traditional handbook-based reliability prediction method, the PoF-based method can provide more accurate prediction for a component. But for the boardlevel electronic product with redundant features, it is very difficult to predict its mission reliability. The challenge lies in the consideration of the interrelationship between those components' PoF models in board. This paper presents a method to model the board as a system, RBD model is introduced to model the system reliability, and then Bayesian Networks (BNs) is proposed to solve the RBD model. As for the components, Monte Carlo simulation is intended to fit their life distribution curves based on the PoF Models of components. And the reliability of the board can be obtained with these curves used as the inputs. Meantime, BNs model provides the basis for diagnosing the fault during the mission, which aims to discover the weaknesses of the system and to guide the improvement of the system-design.

Original languageEnglish
Title of host publicationProceedings of 2015 the 1st International Conference on Reliability Systems Engineering, ICRSE 2015
EditorsShunong Zhang, Zili Wang
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781467385565
DOIs
StatePublished - 24 Dec 2015
Event1st International Conference on Reliability Systems Engineering, ICRSE 2015 - Beijing, China
Duration: 21 Oct 201523 Oct 2015

Publication series

NameProceedings of 2015 the 1st International Conference on Reliability Systems Engineering, ICRSE 2015

Conference

Conference1st International Conference on Reliability Systems Engineering, ICRSE 2015
Country/TerritoryChina
CityBeijing
Period21/10/1523/10/15

Keywords

  • Bayesian Networks
  • PoF
  • RBD
  • fault prediction

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