Microscopic deformation at a crack tip in a ferroelectric material

W. Yang; F. Fang; T. Zhu

Microscopic deformation at a crack tip in a ferroelectric material

W. Yang^*
, F. Fang
, T. Zhu

^*Corresponding author for this work

Tsinghua University

Research output: Contribution to journal › Conference article › peer-review

1 Scopus citations

Abstract

We discuss the microscopic deformation at the crack tip of ferroelectric ceramics by domain switching. Experiment for polycrystal ferroelectrics after out-of-plane poling indicates the crack tip domain switch by the application of a lateral electric field. The theory of crack tip domain switch is presented to explain electric fracture. The analysis is developed for both in-plane and out-of-plane poling. Implication on how to raise the fracture toughness of ferroelectrics will be addressed.

Original language	English
Pages (from-to)	I/-
Journal	Key Engineering Materials
Volume	183
State	Published - 2000
Externally published	Yes
Event	4th International Conference on Fracture and Strength of Solids - Pohang, South Korea Duration: 16 Aug 2000 → 18 Aug 2000

Cite this

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title = "Microscopic deformation at a crack tip in a ferroelectric material",

abstract = "We discuss the microscopic deformation at the crack tip of ferroelectric ceramics by domain switching. Experiment for polycrystal ferroelectrics after out-of-plane poling indicates the crack tip domain switch by the application of a lateral electric field. The theory of crack tip domain switch is presented to explain electric fracture. The analysis is developed for both in-plane and out-of-plane poling. Implication on how to raise the fracture toughness of ferroelectrics will be addressed.",

author = "W. Yang and F. Fang and T. Zhu",

year = "2000",

language = "英语",

volume = "183",

pages = "I/--",

journal = "Key Engineering Materials",

issn = "1013-9826",

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note = "4th International Conference on Fracture and Strength of Solids ; Conference date: 16-08-2000 Through 18-08-2000",

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T1 - Microscopic deformation at a crack tip in a ferroelectric material

AU - Yang, W.

AU - Fang, F.

AU - Zhu, T.

PY - 2000

Y1 - 2000

N2 - We discuss the microscopic deformation at the crack tip of ferroelectric ceramics by domain switching. Experiment for polycrystal ferroelectrics after out-of-plane poling indicates the crack tip domain switch by the application of a lateral electric field. The theory of crack tip domain switch is presented to explain electric fracture. The analysis is developed for both in-plane and out-of-plane poling. Implication on how to raise the fracture toughness of ferroelectrics will be addressed.

AB - We discuss the microscopic deformation at the crack tip of ferroelectric ceramics by domain switching. Experiment for polycrystal ferroelectrics after out-of-plane poling indicates the crack tip domain switch by the application of a lateral electric field. The theory of crack tip domain switch is presented to explain electric fracture. The analysis is developed for both in-plane and out-of-plane poling. Implication on how to raise the fracture toughness of ferroelectrics will be addressed.

UR - https://www.scopus.com/pages/publications/0033718242

M3 - 会议文章

AN - SCOPUS:0033718242

SN - 1013-9826

VL - 183

SP - I/-

JO - Key Engineering Materials

JF - Key Engineering Materials

T2 - 4th International Conference on Fracture and Strength of Solids

Y2 - 16 August 2000 through 18 August 2000

ER -

Microscopic deformation at a crack tip in a ferroelectric material

Abstract

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