Methodology for conducting the integrated verification of product reliability with test date acquired in the development phase

Yu Zhao; Min Huang; Dan Yu; Lai Wei

Methodology for conducting the integrated verification of product reliability with test date acquired in the development phase

Yu Zhao^*
, Min Huang
, Dan Yu
, Lai Wei

^*Corresponding author for this work

School of Reliability and Systems Engineering

Research output: Contribution to journal › Article › peer-review

5 Scopus citations

Abstract

For reducing the amount of necessary test sample size during the reliability verification with specified risk level, this paper presents a method to make the full use of the reliability test data acquired in the product development phase which will be able to reduce the amount of necessary test sample size and then reduce the risk level.

Original language	English
Pages (from-to)	637-640
Number of pages	4
Journal	Hangkong Xuebao/Acta Aeronautica et Astronautica Sinica
Volume	26
Issue number	5
State	Published - Sep 2005

Keywords

One-shot item
Reliability verification
Single sample inspection

Cite this

@article{c04ff728bd59490699bf1d39fbb56607,

title = "Methodology for conducting the integrated verification of product reliability with test date acquired in the development phase",

abstract = "For reducing the amount of necessary test sample size during the reliability verification with specified risk level, this paper presents a method to make the full use of the reliability test data acquired in the product development phase which will be able to reduce the amount of necessary test sample size and then reduce the risk level.",

keywords = "One-shot item, Reliability verification, Single sample inspection",

author = "Yu Zhao and Min Huang and Dan Yu and Lai Wei",

year = "2005",

month = sep,

language = "英语",

volume = "26",

pages = "637--640",

journal = "Hangkong Xuebao/Acta Aeronautica et Astronautica Sinica",

issn = "1000-6893",

publisher = "Chinese Society of Astronautics",

number = "5",

}

TY - JOUR

T1 - Methodology for conducting the integrated verification of product reliability with test date acquired in the development phase

AU - Zhao, Yu

AU - Huang, Min

AU - Yu, Dan

AU - Wei, Lai

PY - 2005/9

Y1 - 2005/9

N2 - For reducing the amount of necessary test sample size during the reliability verification with specified risk level, this paper presents a method to make the full use of the reliability test data acquired in the product development phase which will be able to reduce the amount of necessary test sample size and then reduce the risk level.

AB - For reducing the amount of necessary test sample size during the reliability verification with specified risk level, this paper presents a method to make the full use of the reliability test data acquired in the product development phase which will be able to reduce the amount of necessary test sample size and then reduce the risk level.

KW - One-shot item

KW - Reliability verification

KW - Single sample inspection

UR - https://www.scopus.com/pages/publications/33645636194

M3 - 文章

AN - SCOPUS:33645636194

SN - 1000-6893

VL - 26

SP - 637

EP - 640

JO - Hangkong Xuebao/Acta Aeronautica et Astronautica Sinica

JF - Hangkong Xuebao/Acta Aeronautica et Astronautica Sinica

IS - 5

ER -

Methodology for conducting the integrated verification of product reliability with test date acquired in the development phase

Abstract

Keywords

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