@inproceedings{ad6ba786958f4a6f8d052952f6feb546,
title = "Method of reliability computer simulation assessment for microelectronic device under multi-failure mechanism",
abstract = "The reliability computer simulation assessment of microelectronic device is based on the PoF (Physics of Failure) model, which contains the parameters such as material, structure, technology and stress. The failure mechanism models and stress damage model are utilized to carry out stress analysis and failure time calculation. A great amount of TTF (Time To failure) samples under every failure point and every failure mechanism can be achieved by modeling and computing. Nevertheless, there is no assessment method for estimating the reliability parameters like failure rate and MTTF (Mean Time to Failures) of the whole microelectronic device. Aiming at this problem, the data processing method in reliability simulation assessment of microelectronic device, by which failure rate and MTTF can be obtained is presented, in which the step of failure distribution fitting and multi-point distributions fusing are given. A case for the method is also presented, which proved suitable for engineering application.",
keywords = "Computer Simulation, Physics of failure, Reliability",
author = "B. Wan and Fu, \{G. C.\}",
note = "Publisher Copyright: {\textcopyright} 2015 Taylor \& Francis Group, London.; 2nd International Conference on Computer, Intelligent and Education Technology, CICET 2015 ; Conference date: 11-04-2015 Through 12-04-2015",
year = "2015",
doi = "10.1201/b18828-226",
language = "英语",
isbn = "9781138028005",
series = "Computing, Control, Information and Education Engineering - Proceedings of the 2015 2nd International Conference on Computer, Intelligent and Education Technology, CICET 2015",
publisher = "CRC Press/Balkema",
pages = "985--988",
editor = "Hsiang-Chuan Liu and Wen-Pei Sung and Wenli Yao",
booktitle = "Computing, Control, Information and Education Engineering - Proceedings of the 2015 2nd International Conference on Computer, Intelligent and Education Technology, CICET 2015",
}