Method of automated BIT false alarms simulation based on EDA

  • Junyou Shi*
  • , Jinzhong Li
  • , Meng Shi
  • *Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

The principle of built-in test false alarm simulation (BFAS) is analyzed, with the definition of BFAS in this paper. Related false alarm inducing factors simulated by electronic design automation (EDA) techniques are determined, including load variations, power supply disturbances and electromagnetic interferences. The concept of false alarm simulation profile is proposed. The types and simulation modes of false alarm inducing events are analyzed. The automated insertion algorithm of false alarm inducing events and the flow of BFAS are established, and verified using a typical circuit. It is shown that this method is feasible and effective, and can be used to analyze false alarms in the development stage.

Original languageEnglish
Title of host publicationProceedings of the 2011 6th IEEE Conference on Industrial Electronics and Applications, ICIEA 2011
Pages1449-1453
Number of pages5
DOIs
StatePublished - 2011
Event2011 6th IEEE Conference on Industrial Electronics and Applications, ICIEA 2011 - Beijing, China
Duration: 21 Jun 201123 Jun 2011

Publication series

NameProceedings of the 2011 6th IEEE Conference on Industrial Electronics and Applications, ICIEA 2011

Conference

Conference2011 6th IEEE Conference on Industrial Electronics and Applications, ICIEA 2011
Country/TerritoryChina
CityBeijing
Period21/06/1123/06/11

Keywords

  • built-in test
  • electronic design automation
  • false alarm
  • model
  • simulation

Fingerprint

Dive into the research topics of 'Method of automated BIT false alarms simulation based on EDA'. Together they form a unique fingerprint.

Cite this