Method for fault characterization parameters calculation of electronic products based on physics failure and reliability sensitivity analysis

Yang Liu; Yufeng Sun; Weiwei Hu; Yaqiu Li

Method for fault characterization parameters calculation of electronic products based on physics failure and reliability sensitivity analysis

Yang Liu
, Yufeng Sun
, Weiwei Hu
, Yaqiu Li

School of Reliability and Systems Engineering

Beihang University

Research output: Contribution to conference › Paper › peer-review

Original language	English
State	Published - 2016
Event	Joint Conference on Machinery Failure Prevention Technology Conference, MFPT 2016 and ISA's 62nd International Instrumentation Symposium, IIS 2016 - Dayton, United States Duration: 24 May 2016 → 26 May 2016

Conference

Conference	Joint Conference on Machinery Failure Prevention Technology Conference, MFPT 2016 and ISA's 62nd International Instrumentation Symposium, IIS 2016
Country/Territory	United States
City	Dayton
Period	24/05/16 → 26/05/16

Cite this

Liu, Y., Sun, Y., Hu, W., & Li, Y. (2016). Method for fault characterization parameters calculation of electronic products based on physics failure and reliability sensitivity analysis. Paper presented at Joint Conference on Machinery Failure Prevention Technology Conference, MFPT 2016 and ISA's 62nd International Instrumentation Symposium, IIS 2016, Dayton, United States.

Liu, Yang ; Sun, Yufeng ; Hu, Weiwei et al. / Method for fault characterization parameters calculation of electronic products based on physics failure and reliability sensitivity analysis. Paper presented at Joint Conference on Machinery Failure Prevention Technology Conference, MFPT 2016 and ISA's 62nd International Instrumentation Symposium, IIS 2016, Dayton, United States.

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title = "Method for fault characterization parameters calculation of electronic products based on physics failure and reliability sensitivity analysis",

author = "Yang Liu and Yufeng Sun and Weiwei Hu and Yaqiu Li",

year = "2016",

language = "英语",

note = "Joint Conference on Machinery Failure Prevention Technology Conference, MFPT 2016 and ISA's 62nd International Instrumentation Symposium, IIS 2016 ; Conference date: 24-05-2016 Through 26-05-2016",

}

Liu, Y, Sun, Y , Hu, W & Li, Y 2016, 'Method for fault characterization parameters calculation of electronic products based on physics failure and reliability sensitivity analysis', Paper presented at Joint Conference on Machinery Failure Prevention Technology Conference, MFPT 2016 and ISA's 62nd International Instrumentation Symposium, IIS 2016, Dayton, United States, 24/05/16 - 26/05/16.

Method for fault characterization parameters calculation of electronic products based on physics failure and reliability sensitivity analysis. / Liu, Yang; Sun, Yufeng ; Hu, Weiwei et al.
2016. Paper presented at Joint Conference on Machinery Failure Prevention Technology Conference, MFPT 2016 and ISA's 62nd International Instrumentation Symposium, IIS 2016, Dayton, United States.

Research output: Contribution to conference › Paper › peer-review

TY - CONF

T1 - Method for fault characterization parameters calculation of electronic products based on physics failure and reliability sensitivity analysis

AU - Liu, Yang

AU - Sun, Yufeng

AU - Hu, Weiwei

AU - Li, Yaqiu

PY - 2016

Y1 - 2016

UR - https://www.scopus.com/pages/publications/84979503812

M3 - 论文

AN - SCOPUS:84979503812

T2 - Joint Conference on Machinery Failure Prevention Technology Conference, MFPT 2016 and ISA's 62nd International Instrumentation Symposium, IIS 2016

Y2 - 24 May 2016 through 26 May 2016

ER -

Method for fault characterization parameters calculation of electronic products based on physics failure and reliability sensitivity analysis

Conference

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