Abstract
In this paper, aluminum corrosion mechanism in switch transistor was analyzed. And a group of NPN type switch transistors contrast electric-thermal cycle tests of whether it is vapor control, passivation protection, equipotential rings exist, and clearance enhancement before package were carried out, respectively. By contrast tests, the aluminum corrosion mechanisms are analyzed. Effects of temperature, moisture (vapor), voltage (electric field) and ion contamination on aluminum corrosion occurrence and degree and speed are analyzed too. As well as the aluminum corrosion configurations, distributions, and related factors are analyzed. Finally, the best measure to control aluminum corrosion through control interior vapor to insulate the necessary condition of corrosion occurrence was recommended.
| Original language | English |
|---|---|
| Pages (from-to) | 222-229 |
| Number of pages | 8 |
| Journal | International Journal of Advancements in Computing Technology |
| Volume | 4 |
| Issue number | 20 |
| DOIs | |
| State | Published - Nov 2012 |
Keywords
- Aluminum corrosion
- Contamination
- Deposition
- Passivation defect
- Vapor
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