Measurement uncertainties of conducted emission

Xiao Wen Xu; Dong Lin Su; Jun Feng Guo; Zhi Hang Liu

Measurement uncertainties of conducted emission

Xiao Wen Xu^*
, Dong Lin Su
, Jun Feng Guo
, Zhi Hang Liu

^*Corresponding author for this work

School of Electronic and Information Engineering

Beihang University
CAST

Research output: Contribution to journal › Article › peer-review

Abstract

Based on the conducted emission measurements for the power line, the measurement uncertainties which affect the Electro Magnetic Compatibility (EMC) test are analyzed. This paper investigates the type A and type B uncertainties and the systemic errors. The results show that the tiny difference of the test setup can bring much difference.

Original language	English
Pages (from-to)	1963-1966
Number of pages	4
Journal	Dianzi Yu Xinxi Xuebao/Journal of Electronics and Information Technology
Volume	28
Issue number	10
State	Published - Oct 2006

Keywords

Conducted emission measurement
EMC
Uncertainty

Cite this

@article{c59e39a5424b42ed867464c829c2d39b,

title = "Measurement uncertainties of conducted emission",

abstract = "Based on the conducted emission measurements for the power line, the measurement uncertainties which affect the Electro Magnetic Compatibility (EMC) test are analyzed. This paper investigates the type A and type B uncertainties and the systemic errors. The results show that the tiny difference of the test setup can bring much difference.",

keywords = "Conducted emission measurement, EMC, Uncertainty",

author = "Xu, \{Xiao Wen\} and Su, \{Dong Lin\} and Guo, \{Jun Feng\} and Liu, \{Zhi Hang\}",

year = "2006",

month = oct,

language = "英语",

volume = "28",

pages = "1963--1966",

journal = "Dianzi Yu Xinxi Xuebao/Journal of Electronics and Information Technology",

issn = "1009-5896",

publisher = "Science Press ",

number = "10",

}

TY - JOUR

T1 - Measurement uncertainties of conducted emission

AU - Xu, Xiao Wen

AU - Su, Dong Lin

AU - Guo, Jun Feng

AU - Liu, Zhi Hang

PY - 2006/10

Y1 - 2006/10

N2 - Based on the conducted emission measurements for the power line, the measurement uncertainties which affect the Electro Magnetic Compatibility (EMC) test are analyzed. This paper investigates the type A and type B uncertainties and the systemic errors. The results show that the tiny difference of the test setup can bring much difference.

AB - Based on the conducted emission measurements for the power line, the measurement uncertainties which affect the Electro Magnetic Compatibility (EMC) test are analyzed. This paper investigates the type A and type B uncertainties and the systemic errors. The results show that the tiny difference of the test setup can bring much difference.

KW - Conducted emission measurement

KW - EMC

KW - Uncertainty

UR - https://www.scopus.com/pages/publications/33751583629

M3 - 文章

AN - SCOPUS:33751583629

SN - 1009-5896

VL - 28

SP - 1963

EP - 1966

JO - Dianzi Yu Xinxi Xuebao/Journal of Electronics and Information Technology

JF - Dianzi Yu Xinxi Xuebao/Journal of Electronics and Information Technology

IS - 10

ER -

Measurement uncertainties of conducted emission

Abstract

Keywords

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