TY - GEN
T1 - Maximum Entropy Adversarial Learning for Generalizable Forgery Detection
AU - Fan, Hongxing
AU - Wu, Jiangtao
AU - Guan, Weinan
AU - Sheng, Lu
N1 - Publisher Copyright:
© The Author(s), under exclusive license to Springer Nature Singapore Pte Ltd. 2026.
PY - 2026
Y1 - 2026
N2 - The generalization of deepfake detectors to unseen manipulation methods is a critical challenge due to model overfitting on method-specific patterns. While adversarial learning is a common remedy, its conventional error-driven objective is flawed because it only encourages a discriminator to be wrong, which can be achieved without merging the distinct feature clusters of different forgery types. We argue for a paradigm shift from making the discriminator wrong to making it utterly confused. To this end, we propose Maximum Entropy Adversarial (MEA) learning, where the feature extractor is trained to generate features that maximize the entropy of the discriminator’s predictions. This objective, by driving the output distribution towards uniformity, compels the learning of a truly unified, method-agnostic representation by collapsing different forgery features into a single cluster. MEA is the core of a synergistic framework, bolstered by a Supervised Contrastive loss to maintain a clear real-vs-fake margin, and a novel Adversarially-Guided Feature Augmentation (AGFA) that creates challenging boundary samples to strengthen generalization. Extensive experiments on benchmarks like Celeb-DF and DFDC validate our approach, demonstrating our method’s superior generalization.
AB - The generalization of deepfake detectors to unseen manipulation methods is a critical challenge due to model overfitting on method-specific patterns. While adversarial learning is a common remedy, its conventional error-driven objective is flawed because it only encourages a discriminator to be wrong, which can be achieved without merging the distinct feature clusters of different forgery types. We argue for a paradigm shift from making the discriminator wrong to making it utterly confused. To this end, we propose Maximum Entropy Adversarial (MEA) learning, where the feature extractor is trained to generate features that maximize the entropy of the discriminator’s predictions. This objective, by driving the output distribution towards uniformity, compels the learning of a truly unified, method-agnostic representation by collapsing different forgery features into a single cluster. MEA is the core of a synergistic framework, bolstered by a Supervised Contrastive loss to maintain a clear real-vs-fake margin, and a novel Adversarially-Guided Feature Augmentation (AGFA) that creates challenging boundary samples to strengthen generalization. Extensive experiments on benchmarks like Celeb-DF and DFDC validate our approach, demonstrating our method’s superior generalization.
KW - Adversarial Learning
KW - Deepfake Detection
KW - Domain Generalization
UR - https://www.scopus.com/pages/publications/105031140491
U2 - 10.1007/978-981-95-5628-1_21
DO - 10.1007/978-981-95-5628-1_21
M3 - 会议稿件
AN - SCOPUS:105031140491
SN - 9789819556274
T3 - Lecture Notes in Computer Science
SP - 298
EP - 312
BT - Pattern Recognition and Computer Vision - 8th Chinese Conference, PRCV 2025, Proceedings
A2 - Kittler, Josef
A2 - Xiong, Hongkai
A2 - Lin, Weiyao
A2 - Yang, Jian
A2 - Chen, Xilin
A2 - Lu, Jiwen
A2 - Yu, Jingyi
A2 - Zheng, Weishi
PB - Springer Science and Business Media Deutschland GmbH
T2 - 8th Chinese Conference on Pattern Recognition and Computer Vision, PRCV 2025
Y2 - 15 October 2025 through 18 October 2025
ER -