Magnetization reorientation induced by interfacial structures in ultrathin disordered FePt film sandwiched by SiO                         2                          layers

Guang Yang; Jing Yan Zhang; Shou Guo Wang; Shao Long Jiang; Yun Chi Zhao; Qi Di Ma; Chao Wang; Bo Wen Dong; Jia Long Liu; Ying Zhang; Young Sun; Zheng Long Wu; Guang Hua Yu

doi:10.1016/j.apsusc.2015.06.134

Magnetization reorientation induced by interfacial structures in ultrathin disordered FePt film sandwiched by SiO ₂ layers

Guang Yang
, Jing Yan Zhang
, Shou Guo Wang^*
, Shao Long Jiang
, Yun Chi Zhao
, Qi Di Ma
, Chao Wang
, Bo Wen Dong
, Jia Long Liu
, Ying Zhang
, Young Sun
, Zheng Long Wu
, Guang Hua Yu

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

6 Scopus citations

Abstract

In general, ultrathin disordered FePt film exhibits in-plane magnetic anisotropy due to large demagnetization fields and negligible volume anisotropy. Here, we demonstrated that magnetization reorientation from in-plane to out-of-plane takes place when ultrathin disordered FePt film is sandwiched by amorphous SiO ₂ layers and annealed at 350 °C. Based on the interfacial and structural analysis from X-ray photoelectron spectroscopy and high resolution transmission electron microscopy, the reorientation originates from the electronic structural changes because of strong bonding between Fe and O atoms at the top FePt/SiO ₂ interface. This interface anisotropy plays a crucial role in the magnetic behaviour, resulting in magnetization reorientation of ultrathin disordered FePt film.

Original language	English
Pages (from-to)	489-493
Number of pages	5
Journal	Applied Surface Science
Volume	353
DOIs	https://doi.org/10.1016/j.apsusc.2015.06.134
State	Published - 30 Oct 2015
Externally published	Yes

Keywords

Interfacial electronic structures
Magnetization reorientation
X-ray photoelectron spectroscopy

Access to Document

10.1016/j.apsusc.2015.06.134

Cite this

Yang, G., Zhang, J. Y., Wang, S. G., Jiang, S. L., Zhao, Y. C., Ma, Q. D., Wang, C., Dong, B. W., Liu, J. L., Zhang, Y., Sun, Y., Wu, Z. L., & Yu, G. H. (2015). Magnetization reorientation induced by interfacial structures in ultrathin disordered FePt film sandwiched by SiO ₂ layers Applied Surface Science, 353, 489-493. https://doi.org/10.1016/j.apsusc.2015.06.134

@article{6135bb05822f4fccbc2f8a3a8b0d7108,

title = " Magnetization reorientation induced by interfacial structures in ultrathin disordered FePt film sandwiched by SiO 2 layers ",

abstract = " In general, ultrathin disordered FePt film exhibits in-plane magnetic anisotropy due to large demagnetization fields and negligible volume anisotropy. Here, we demonstrated that magnetization reorientation from in-plane to out-of-plane takes place when ultrathin disordered FePt film is sandwiched by amorphous SiO 2 layers and annealed at 350 °C. Based on the interfacial and structural analysis from X-ray photoelectron spectroscopy and high resolution transmission electron microscopy, the reorientation originates from the electronic structural changes because of strong bonding between Fe and O atoms at the top FePt/SiO 2 interface. This interface anisotropy plays a crucial role in the magnetic behaviour, resulting in magnetization reorientation of ultrathin disordered FePt film.",

keywords = "Interfacial electronic structures, Magnetization reorientation, X-ray photoelectron spectroscopy",

author = "Guang Yang and Zhang, \{Jing Yan\} and Wang, \{Shou Guo\} and Jiang, \{Shao Long\} and Zhao, \{Yun Chi\} and Ma, \{Qi Di\} and Chao Wang and Dong, \{Bo Wen\} and Liu, \{Jia Long\} and Ying Zhang and Young Sun and Wu, \{Zheng Long\} and Yu, \{Guang Hua\}",

note = "Publisher Copyright: {\textcopyright} 2015 Elsevier B.V.",

year = "2015",

month = oct,

day = "30",

doi = "10.1016/j.apsusc.2015.06.134",

language = "英语",

volume = "353",

pages = "489--493",

journal = "Applied Surface Science",

issn = "0169-4332",

publisher = "Elsevier B.V.",

}

Yang, G, Zhang, JY, Wang, SG, Jiang, SL, Zhao, YC, Ma, QD, Wang, C, Dong, BW, Liu, JL, Zhang, Y, Sun, Y, Wu, ZL & Yu, GH 2015, ' Magnetization reorientation induced by interfacial structures in ultrathin disordered FePt film sandwiched by SiO ₂ layers ', Applied Surface Science, vol. 353, pp. 489-493. https://doi.org/10.1016/j.apsusc.2015.06.134

Magnetization reorientation induced by interfacial structures in ultrathin disordered FePt film sandwiched by SiO ₂ layers . / Yang, Guang; Zhang, Jing Yan; Wang, Shou Guo et al.
In: Applied Surface Science, Vol. 353, 30.10.2015, p. 489-493.

Research output: Contribution to journal › Article › peer-review

TY - JOUR

T1 - Magnetization reorientation induced by interfacial structures in ultrathin disordered FePt film sandwiched by SiO 2 layers

AU - Yang, Guang

AU - Zhang, Jing Yan

AU - Wang, Shou Guo

AU - Jiang, Shao Long

AU - Zhao, Yun Chi

AU - Ma, Qi Di

AU - Wang, Chao

AU - Dong, Bo Wen

AU - Liu, Jia Long

AU - Zhang, Ying

AU - Sun, Young

AU - Wu, Zheng Long

AU - Yu, Guang Hua

PY - 2015/10/30

Y1 - 2015/10/30

N2 - In general, ultrathin disordered FePt film exhibits in-plane magnetic anisotropy due to large demagnetization fields and negligible volume anisotropy. Here, we demonstrated that magnetization reorientation from in-plane to out-of-plane takes place when ultrathin disordered FePt film is sandwiched by amorphous SiO 2 layers and annealed at 350 °C. Based on the interfacial and structural analysis from X-ray photoelectron spectroscopy and high resolution transmission electron microscopy, the reorientation originates from the electronic structural changes because of strong bonding between Fe and O atoms at the top FePt/SiO 2 interface. This interface anisotropy plays a crucial role in the magnetic behaviour, resulting in magnetization reorientation of ultrathin disordered FePt film.

AB - In general, ultrathin disordered FePt film exhibits in-plane magnetic anisotropy due to large demagnetization fields and negligible volume anisotropy. Here, we demonstrated that magnetization reorientation from in-plane to out-of-plane takes place when ultrathin disordered FePt film is sandwiched by amorphous SiO 2 layers and annealed at 350 °C. Based on the interfacial and structural analysis from X-ray photoelectron spectroscopy and high resolution transmission electron microscopy, the reorientation originates from the electronic structural changes because of strong bonding between Fe and O atoms at the top FePt/SiO 2 interface. This interface anisotropy plays a crucial role in the magnetic behaviour, resulting in magnetization reorientation of ultrathin disordered FePt film.

KW - Interfacial electronic structures

KW - Magnetization reorientation

KW - X-ray photoelectron spectroscopy

UR - https://www.scopus.com/pages/publications/84941961575

U2 - 10.1016/j.apsusc.2015.06.134

DO - 10.1016/j.apsusc.2015.06.134

M3 - 文章

AN - SCOPUS:84941961575

SN - 0169-4332

VL - 353

SP - 489

EP - 493

JO - Applied Surface Science

JF - Applied Surface Science

ER -

Magnetization reorientation induced by interfacial structures in ultrathin disordered FePt film sandwiched by SiO ₂ layers

Abstract

Keywords

Access to Document

Other files and links

Fingerprint

Cite this