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Lightweight You Only Look Once-based automatic defect detection in wire arc additive manufacturing

  • Runsheng Li
  • , Hui Ma
  • , Baoqiang Cong*
  • , Yongjun Shi
  • , Caiyou Zeng
  • , Yanzhen Zhang
  • , Boce Xue
  • , Chaolin Tan*
  • *Corresponding author for this work
  • China University of Petroleum (East China)
  • Beijing Institute of Petrochemical Technology
  • Soochow University

Research output: Contribution to journalArticlepeer-review

Abstract

Wire arc additive manufacturing (WAAM) technology has achieved significant advancements in fabricating complex metal components, yet defects such as surface porosity, lack of fusion, and slag inclusion continue to compromise quality and efficiency. To address challenges in detecting welding slag and micro-pores, we introduce an enhanced You Only Look Once (YOLO)v8n-Attention-Refined Feature Module (ARFM) architecture integrating receptive field attention convolution, an attention-based feature pyramid network, and the Focaler-minimum point distance intersection over union metric. This integration markedly improves the precision and resilience of defect recognition. Moreover, we assessed the defect detection capabilities of YOLOv3t, YOLOv5n, YOLOv6n, YOLOv8n, YOLOv9t, and YOLOv10n in WAAM and developed a composite defect dataset incorporating aluminum, titanium, and stainless steel specimens. The experiments reveal that YOLOv8n achieved the highest overall detection effectiveness (mean average precision [mAP]@0.5 = 0.921). YOLOv10n exhibited marginal superiority in slag inclusion detection (mAP@0.5 = 0.886) with a peak throughput of 54.35 frames per second (FPS), while YOLOv5n converged the fastest within 500 epochs. Following the introduction of ARFM, mAP@0.5 increased to 0.944 (+2.4%), and slag inclusion detection reached 0.929 (+7.3%). However, the frame rate declined to 38 FPS, which suffices for basic real-time monitoring but remains inadequate for high real-time scenarios. This study provides an important reference for deploying YOLO-series models for real-time monitoring of WAAM and closed-loop control systems.

Original languageEnglish
Article number025210035
JournalMaterials Science in Additive Manufacturing
Volume4
Issue number4
DOIs
StatePublished - 10 Dec 2025

Keywords

  • Asymptotic feature pyramid network
  • Defect detection
  • Focaler-minimum point distance intersection over union
  • Lightweight You Only Look Once
  • Receptive field augmented convolution
  • Wire arc additive manufacturing

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