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Life and reliability prediction of the multi-stress accelerated life testing based on grey support vector machines

  • F. Sun*
  • , X. Li
  • , T. Jiang
  • *Corresponding author for this work
  • Beihang University

Research output: Chapter in Book/Report/Conference proceedingChapterpeer-review

Abstract

There are many difficulties in statistical analysis of multi-stress accelerated life testing, such as establishing the accelerated model and solving pluralism likelihood equations. With a focus on these difficulties, the Grey-SVM based life and reliability prediction method for multi-stress accelerated life testing is proposed, with the accelerated stress level and the reliability as SVM inputs, and the corresponding Grey AGO processing failure data as outputs. Simulation and case study shows that the method has high prediction accuracy and with less amount of training samples than neural network.

Original languageEnglish
Title of host publicationLecture Notes in Mechanical Engineering
PublisherSpringer Heidelberg
Pages273-282
Number of pages10
DOIs
StatePublished - 2014

Publication series

NameLecture Notes in Mechanical Engineering
Volume9
ISSN (Print)2195-4356
ISSN (Electronic)2195-4364

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