@inproceedings{c7866e74544e44678765201ada3eb4a4,
title = "Life and reliability prediction of constant-stress accelerated degradation testing using time series method",
abstract = "Long-term prediction of product life of Accelerated Degradation Testing (ADT) must take into account the stochastic and periodic nature of environmental variables. This paper proposes a new complex time series modeling procedure to make an overall description of accelerated degradation path in ADT. Based on accelerated degradation path prediction, this paper evaluates product life and reliability at use-stress level. A four electric stress levels Constant-Stress ADT (CSADT) of miniature bulb is conducted to verify the proposed CSADT life prediction method. A comparison between prediction life and real life of miniature bulb is processed and the result shows that life prediction by the proposed method is creditable.",
author = "Li Wang and Xiaoyang Li and Tingmin Jiang and Tingting Huang",
year = "2010",
language = "英语",
isbn = "9780415604277",
series = "Reliability, Risk and Safety: Back to the Future",
pages = "1222--1226",
booktitle = "Reliability, Risk and Safety",
note = "European Safety and Reliability Annual Conference: Reliability, Risk and Safety: Back to the Future, ESREL 2010 ; Conference date: 05-09-2010 Through 09-09-2010",
}