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Least-squares reverse time migration for flaw characterisation using ultrasonic bulk waves

  • J. Rao*
  • , Z. Fan
  • *Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Accurate detection and characterization of flaws are very important in the assessment of structural integrity of critical structures in aerospace and nuclear industry. In this paper, an effective ultrasonic imaging technique based on least-squares reverse time migration (LSRTM) is developed for imaging flaws. Reverse time migration (RTM) is a powerful wave-equation-based approach and it has the ability to account for rapid spatial velocity variations and to utilize all wavefront information. It is based on cross-correlating the forward wavefield with the back-propagated wavefield scattered from flaws. To achieve images with better quality, the solution can be obtained by iteratively finding an image generating the modeled data which can best match the measured data in a least-squares sense, i.e. least-squares migration (LSM). Combining RTM and LSM, the LSRTM algorithm is applied to the measured data from the virtual experiment and the physical laboratory experiment, and the results show high-quality reconstructed images for flaw identification.

Original languageEnglish
Title of host publication9th ECCOMAS Thematic Conference on Smart Structures and Materials, SMART 2019
EditorsAyech Benjeddou, Nazih Mechbal, Jean-Francois Deu
PublisherInternational Center for Numerical Methods in Engineering
Pages207-214
Number of pages8
ISBN (Electronic)9788494919466
StatePublished - 2019
Externally publishedYes
Event9th ECCOMAS Thematic Conference on Smart Structures and Materials, SMART 2019 - Paris, France
Duration: 8 Jul 201911 Jul 2019

Publication series

Name9th ECCOMAS Thematic Conference on Smart Structures and Materials, SMART 2019

Conference

Conference9th ECCOMAS Thematic Conference on Smart Structures and Materials, SMART 2019
Country/TerritoryFrance
CityParis
Period8/07/1911/07/19

Keywords

  • Flaw characterization
  • Least-squares reverse time migration
  • Ultrasonic imaging

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