Learning deep embeddings via margin-based discriminate loss

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Deep metric learning has gained much popularity in recent years, following the success of deep learning. However, existing frameworks of deep metric learning based on contrastive loss and triplet loss often suffer from slow convergence, partially because they employ only one positive example and one negative example while not interacting with the other positive or negative examples in each update. In this paper, we firstly propose the strict discrimination concept to seek an optimal embedding space. Based on this concept, we then propose a new metric learning objective called Margin-based Discriminate Loss which tries to keep the similar and the dissimilar strictly discriminate by pulling multiple positive examples together while pushing multiple negative examples away at each update. Importantly, it doesn’t need expensive sampling strategies. We demonstrate the validity of our proposed loss compared with the triplet loss as well as other competing loss functions for a variety of tasks on fine-grained image clustering and retrieval.

Original languageEnglish
Title of host publicationStructural, Syntactic, and Statistical Pattern Recognition - Joint IAPR International Workshop, S+SSPR 2018, Proceedings
EditorsEdwin R. Hancock, Tin Kam Ho, Battista Biggio, Richard C. Wilson, Antonio Robles-Kelly, Xiao Bai
PublisherSpringer Verlag
Pages107-115
Number of pages9
ISBN (Print)9783319977843
DOIs
StatePublished - 2018
EventJoint IAPR International Workshops on Structural and Syntactic Pattern Recognition, SSPR 2018 and Statistical Techniques in Pattern Recognition, SPR 2018 - Beijing, China
Duration: 17 Aug 201819 Aug 2018

Publication series

NameLecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)
Volume11004 LNCS
ISSN (Print)0302-9743
ISSN (Electronic)1611-3349

Conference

ConferenceJoint IAPR International Workshops on Structural and Syntactic Pattern Recognition, SSPR 2018 and Statistical Techniques in Pattern Recognition, SPR 2018
Country/TerritoryChina
CityBeijing
Period17/08/1819/08/18

Keywords

  • Deep embedding
  • Metric learning
  • Neural networks
  • Representation learning

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