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Junction temperature measurement to optimize thermal design of LED arrays

  • Huaiyu Ye
  • , Hongyu Tang
  • , Stanley Leung
  • , Cheng Qian
  • , Xuejun Fan
  • , Guoqi Zhang
  • Delft University of Technology
  • CAS - Institute of Semiconductors
  • Changzhou Institute of Technology Research for Solid State Lighting
  • Lamar University

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

The drive to increase electrical currents input, and to achieve high lumen output for High Brightness Light Emitting Diode (HB LED) has led to a series of thermal problems. Hence, thermal management is one of key design parameters as the temperature directly affecting the maximum light output, quality, reliability and life time. For LED arrays, the arrangement of chips will affect the thermal performance and junction temperature is very important in the design. However, because direct junction temperature determination is hard to detect due to the encapsulation, indirect methods are more preferred. Among them, the diode forward-voltage method is the most accurate one. Therefore, we used the diode forward-voltage method to optimize thermal design of LED arrays in this work.

Original languageEnglish
Title of host publication2015 12th China International Forum on Solid State Lighting, SSLCHINA 2015
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages47-51
Number of pages5
ISBN (Electronic)9781509001767
DOIs
StatePublished - 17 Dec 2015
Externally publishedYes
Event12th China International Forum on Solid State Lighting, SSLCHINA 2015 - Shenzhen, China
Duration: 2 Nov 20154 Nov 2015

Publication series

Name2015 12th China International Forum on Solid State Lighting, SSLCHINA 2015

Conference

Conference12th China International Forum on Solid State Lighting, SSLCHINA 2015
Country/TerritoryChina
CityShenzhen
Period2/11/154/11/15

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