TY - GEN
T1 - Joint geometrical and statistical alignment for visual domain adaptation
AU - Zhang, Jing
AU - Li, Wanqing
AU - Ogunbona, Philip
N1 - Publisher Copyright:
© 2017 IEEE.
PY - 2017/11/6
Y1 - 2017/11/6
N2 - This paper presents a novel unsupervised domain adaptation method for cross-domain visual recognition. We propose a unified framework that reduces the shift between domains both statistically and geometrically, referred to as Joint Geometrical and Statistical Alignment (JGSA). Specifically, we learn two coupled projections that project the source domain and target domain data into lowdimensional subspaces where the geometrical shift and distribution shift are reduced simultaneously. The objective function can be solved efficiently in a closed form. Extensive experiments have verified that the proposed method significantly outperforms several state-of-the-art domain adaptation methods on a synthetic dataset and three different real world cross-domain visual recognition tasks.
AB - This paper presents a novel unsupervised domain adaptation method for cross-domain visual recognition. We propose a unified framework that reduces the shift between domains both statistically and geometrically, referred to as Joint Geometrical and Statistical Alignment (JGSA). Specifically, we learn two coupled projections that project the source domain and target domain data into lowdimensional subspaces where the geometrical shift and distribution shift are reduced simultaneously. The objective function can be solved efficiently in a closed form. Extensive experiments have verified that the proposed method significantly outperforms several state-of-the-art domain adaptation methods on a synthetic dataset and three different real world cross-domain visual recognition tasks.
UR - https://www.scopus.com/pages/publications/85044304033
U2 - 10.1109/CVPR.2017.547
DO - 10.1109/CVPR.2017.547
M3 - 会议稿件
AN - SCOPUS:85044304033
T3 - Proceedings - 30th IEEE Conference on Computer Vision and Pattern Recognition, CVPR 2017
SP - 5150
EP - 5158
BT - Proceedings - 30th IEEE Conference on Computer Vision and Pattern Recognition, CVPR 2017
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 30th IEEE Conference on Computer Vision and Pattern Recognition, CVPR 2017
Y2 - 21 July 2017 through 26 July 2017
ER -