Investigation on temperature stability of scale factor for an optical voltage sensor based on Pockels effect

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Abstract

The temperature stability of scale factor (SF) has been analyzed and tested systematically for an optical voltage sensor (OVS) based on Pockels effect in this paper. The cardinal temperature sensitive parameters in sensor head and their impacts on SF are brought out by theoretical analysis and simulation method. Corresponding experiments are arranged to verify the validity of theoretical analysis. A real-time temperature compensation system is fabricated to reduce the error of SF in temperature fluctuation environment and its effectiveness is certified by experiment.

Original languageEnglish
Title of host publicationOptoelectronics Engineering and Information Technologies in Industry
Pages277-280
Number of pages4
DOIs
StatePublished - 2013
Event2nd International Conference on Opto-Electronics Engineering and Materials Research, OEMR 2013 - Zhengzhou, Henan, China
Duration: 19 Oct 201320 Oct 2013

Publication series

NameAdvanced Materials Research
Volume760-762
ISSN (Print)1022-6680

Conference

Conference2nd International Conference on Opto-Electronics Engineering and Materials Research, OEMR 2013
Country/TerritoryChina
CityZhengzhou, Henan
Period19/10/1320/10/13

Keywords

  • Optical voltage sensor (OVS)
  • Pockels effect
  • Scale factor (SF)
  • Temperature stability

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