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Interfacial defect complex at the MgO/SrTiO3 heterojunction and its electronic impact

  • Junjie Li
  • , Shuhui Lv
  • , Chunlin Chen
  • , Sumei Huang
  • , Zhongchang Wang*
  • *Corresponding author for this work
  • East China Normal University
  • Tohoku University
  • Changchun University of Science and Technology

Research output: Contribution to journalArticlepeer-review

Abstract

Atomic defects exist in various heterojunctions and can remarkably affect their properties, yet it remains a challenging task to identify each individual defect. Here, by combining advanced transmission electron microscopy, spectroscopy and first-principles calculations, we obtain a structural and element-selective imaging of defects at an interface between MgO and SrTiO3. We demonstrate that even for structurally simple MgO and SrTiO3, their interface involves a defect complex comprising of substitutional Ti and Mg vacancies, which induce a marked shift in electronic states. The Ti atoms diffused into MgO exhibit a valence state of +4 and a certain degree of covalency to the surrounding oxygen. Such an ability to determine defects allows us to precisely alter heterojunctions so as to critically improve the device performances.

Original languageEnglish
Pages (from-to)51002-51007
Number of pages6
JournalRSC Advances
Volume4
Issue number92
DOIs
StatePublished - 2014
Externally publishedYes

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