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Interface evolution of TiAl/Ti6242 transient liquid phase joint using Ti, Cu foils as insert metals

  • Hui Ping Duan*
  • , K. H. Bohm
  • , V. Ventzke
  • , M. Kocak
  • *Corresponding author for this work
  • Helmholtz-Zentrum Hereon

Research output: Contribution to journalArticlepeer-review

Abstract

The interface evolution of TiAl/Ti6242 joint produced by transient liquid phase(TLP) bonding with Ti, Cu foils as insert metals was investigated. The results show that the surface oxide layer on TiAl plays a very important role in the formation process of the joint. A 'bridge' effect is observed because of the presence of the oxide layer on the surface of TiAl. The diffusion behavior of Cu atoms in TiAl is strongly controlled by the vacancies beneath the surface of TiAl. Based on the interface diffusion and interface wettability, a mechanism for the effect of bonding pressure, bonding temperature, holding time and stacking sequence of the insert foils on the joint formation process were proposed.

Original languageEnglish
Pages (from-to)375-378
Number of pages4
JournalTransactions of Nonferrous Metals Society of China (English Edition)
Volume15
Issue number2
StatePublished - Apr 2005

Keywords

  • Interface evolution
  • Intermetallics
  • Mechanism
  • Ti6242 transient liquid phase bonding
  • TiAl

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