Interface atomic-scale structure and its impact on quantum electron transport

  • Zhongchang Wang*
  • , Mitsuhiro Saito
  • , Susumu Tsukimoto
  • , Yuichi Ikuhara
  • *Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

Abstract

Local structure, chemistry, and bonding at interfaces often radically affect the properties of materials. A combination of scanning transmission electron microscopy and density functional theory calculations reveals an atomic layer of carbon at a SiC/ Ti3SiC2 interface in Ohmic contact to p-type SiC (see image), which results in stronger adhesion, a lowered Schottky barrier, and enhanced transport. This is a key factor to understanding the origin of the Ohmic nature.

Original languageEnglish
Pages (from-to)4966-4969
Number of pages4
JournalAdvanced Materials
Volume21
Issue number48
DOIs
StatePublished - 28 Dec 2009
Externally publishedYes

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