Abstract
Local structure, chemistry, and bonding at interfaces often radically affect the properties of materials. A combination of scanning transmission electron microscopy and density functional theory calculations reveals an atomic layer of carbon at a SiC/ Ti3SiC2 interface in Ohmic contact to p-type SiC (see image), which results in stronger adhesion, a lowered Schottky barrier, and enhanced transport. This is a key factor to understanding the origin of the Ohmic nature.
| Original language | English |
|---|---|
| Pages (from-to) | 4966-4969 |
| Number of pages | 4 |
| Journal | Advanced Materials |
| Volume | 21 |
| Issue number | 48 |
| DOIs | |
| State | Published - 28 Dec 2009 |
| Externally published | Yes |
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