TY - GEN
T1 - Integrated aging model of rubber seal ring based on material structure reconfiguration
AU - Wang, Shaoping
AU - Hong, Wei
AU - Shi, Jian
AU - Tomovic, Mileta
PY - 2013
Y1 - 2013
N2 - Aging is the main failure mechanism of rubber seal ring during the storage period for hydraulic actuator. Considering the influence of temperature, oxygen concentration and mechanical force, this paper presents an integrated aging model based on the volume variation, elasticity modulus and molecular reconfiguration. With the slot flow theory, we get the relationship between the material structure variation and oil leakage for hydraulic actuator. Through measuring the leakage dynamically, it is easy to predict the residual life. Application indicates that the integrated aging model is more precise to the real aging description for rubber seal ring.
AB - Aging is the main failure mechanism of rubber seal ring during the storage period for hydraulic actuator. Considering the influence of temperature, oxygen concentration and mechanical force, this paper presents an integrated aging model based on the volume variation, elasticity modulus and molecular reconfiguration. With the slot flow theory, we get the relationship between the material structure variation and oil leakage for hydraulic actuator. Through measuring the leakage dynamically, it is easy to predict the residual life. Application indicates that the integrated aging model is more precise to the real aging description for rubber seal ring.
KW - integrated aging model
KW - material perfromance degradation
KW - molecular structure
KW - rubber seal ring
UR - https://www.scopus.com/pages/publications/84881392196
U2 - 10.1109/ICIEA.2013.6566523
DO - 10.1109/ICIEA.2013.6566523
M3 - 会议稿件
AN - SCOPUS:84881392196
SN - 9781467363211
T3 - Proceedings of the 2013 IEEE 8th Conference on Industrial Electronics and Applications, ICIEA 2013
SP - 1054
EP - 1058
BT - Proceedings of the 2013 IEEE 8th Conference on Industrial Electronics and Applications, ICIEA 2013
T2 - 2013 IEEE 8th Conference on Industrial Electronics and Applications, ICIEA 2013
Y2 - 19 June 2013 through 21 June 2013
ER -