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In-situ measurement of residual magnetic field in SERF atomic magnetometer based on transient response

  • Di Zhan
  • , Yaoguo Wang
  • , Jixi Lu*
  • *Corresponding author for this work
  • Beihang University
  • Hefei National Laboratory

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Maintaining a near-zero magnetic field condition is a requisite for atomic magnetometer under the spin-exchange relaxation-free (SERF) regime. Therefore, the precise determination of the residual magnetic fields is of great significance. Herein, we proposed an in-situ measurement method of residual magnetic fields in a dual-beam atomic magnetometer based on a transient response of the transverse polarization along the probe beam direction after switching off the pump beam. Proceeding from the Bloch equation, we established a complete evolution expression of the polarization vector under any static residual magnetic field with the pump beam switched off. On this basis, we analyzed the transient response of the transverse polarization by numerical simulation under different situations of residual magnetic fields. Besides, we also considered two possible conditions when the residual magnetic fields are relatively large or small, respectively. Accordingly, we presented an efficient and convenient estimation method of the residual magnetic fields based on certain time characteristics of the transient response. We verified the feasibility of our method by experiment and achieved a triaxial residual magnetic fields measurement within 0.5 s. This method can realize an insitu and real-time measurement of the residual magnetic fields in a fast and convenient way. Furthermore, this method can evaluate the effectiveness of different magnetic field compensation methods without introducing any modulation or extra devices.

Original languageEnglish
Title of host publicationAdvanced Sensor Systems and Applications XIV
EditorsMinghong Yang, Chang-Seok Kim, Xinyu Fan, Jianzhong Zhang
PublisherSPIE
ISBN (Electronic)9781510682146
DOIs
StatePublished - 2024
EventAdvanced Sensor Systems and Applications XIV 2024 - Nantong, China
Duration: 13 Oct 202415 Oct 2024

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume13243
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Conference

ConferenceAdvanced Sensor Systems and Applications XIV 2024
Country/TerritoryChina
CityNantong
Period13/10/2415/10/24

Keywords

  • Atomic magnetometer
  • SERF
  • magnetic field compensation
  • residual magnetic field
  • transient response

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