Impacts of test suite's class imbalance on spectrum-based fault localization techniques

Peifeng Rao; Zheng Zheng; Tsong Yueh Chen; Nan Wang; Kaiyuan Cai

doi:10.1109/QSIC.2013.18

Impacts of test suite's class imbalance on spectrum-based fault localization techniques

Peifeng Rao
, Zheng Zheng
, Tsong Yueh Chen
, Nan Wang
, Kaiyuan Cai

Beihang University
Swinburne University of Technology

Research output: Contribution to conference › Paper › peer-review

25 Scopus citations

Abstract

Spectrum-based fault localization (SBFL) uses the execution results of test cases to debug. There are two types of SBFL techniques: one using conventional slices, and the other using metamorphic slices. This paper investigates the ratio between non-violated and violated metamorphic test groups of test suites for SBFL techniques using metamorphic slices. We have observed that the higher the ratio of passed metamorphic test groups to failed metamorphic test groups, the less effective the SBFL techniques using metamorphic slices. This observation is consistent with what has been observed in SBFL techniques using conventional slices. Besides, a new real-life fault in schedule2 of Siemens Suite is identified in our experiments.

Original language	English
Pages	260-267
Number of pages	8
DOIs	https://doi.org/10.1109/QSIC.2013.18
State	Published - 2013
Event	13th International Conference on Quality Software, QSIC 2013 - Nanjing, Jiangsu, China Duration: 29 Jul 2013 → 30 Jul 2013

Conference

Conference	13th International Conference on Quality Software, QSIC 2013
Country/Territory	China
City	Nanjing, Jiangsu
Period	29/07/13 → 30/07/13

Keywords

class imbalance
metamorphic slices
metamorphic testing
spectrum-based fault localization
test oracle

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10.1109/QSIC.2013.18

Cite this

@conference{acbb5249a64041f3ab1df2e192ea637e,

title = "Impacts of test suite's class imbalance on spectrum-based fault localization techniques",

abstract = "Spectrum-based fault localization (SBFL) uses the execution results of test cases to debug. There are two types of SBFL techniques: one using conventional slices, and the other using metamorphic slices. This paper investigates the ratio between non-violated and violated metamorphic test groups of test suites for SBFL techniques using metamorphic slices. We have observed that the higher the ratio of passed metamorphic test groups to failed metamorphic test groups, the less effective the SBFL techniques using metamorphic slices. This observation is consistent with what has been observed in SBFL techniques using conventional slices. Besides, a new real-life fault in schedule2 of Siemens Suite is identified in our experiments.",

keywords = "class imbalance, metamorphic slices, metamorphic testing, spectrum-based fault localization, test oracle",

author = "Peifeng Rao and Zheng Zheng and Chen, \{Tsong Yueh\} and Nan Wang and Kaiyuan Cai",

year = "2013",

doi = "10.1109/QSIC.2013.18",

language = "英语",

pages = "260--267",

note = "13th International Conference on Quality Software, QSIC 2013 ; Conference date: 29-07-2013 Through 30-07-2013",

}

TY - CONF

T1 - Impacts of test suite's class imbalance on spectrum-based fault localization techniques

AU - Rao, Peifeng

AU - Zheng, Zheng

AU - Chen, Tsong Yueh

AU - Wang, Nan

AU - Cai, Kaiyuan

PY - 2013

Y1 - 2013

N2 - Spectrum-based fault localization (SBFL) uses the execution results of test cases to debug. There are two types of SBFL techniques: one using conventional slices, and the other using metamorphic slices. This paper investigates the ratio between non-violated and violated metamorphic test groups of test suites for SBFL techniques using metamorphic slices. We have observed that the higher the ratio of passed metamorphic test groups to failed metamorphic test groups, the less effective the SBFL techniques using metamorphic slices. This observation is consistent with what has been observed in SBFL techniques using conventional slices. Besides, a new real-life fault in schedule2 of Siemens Suite is identified in our experiments.

AB - Spectrum-based fault localization (SBFL) uses the execution results of test cases to debug. There are two types of SBFL techniques: one using conventional slices, and the other using metamorphic slices. This paper investigates the ratio between non-violated and violated metamorphic test groups of test suites for SBFL techniques using metamorphic slices. We have observed that the higher the ratio of passed metamorphic test groups to failed metamorphic test groups, the less effective the SBFL techniques using metamorphic slices. This observation is consistent with what has been observed in SBFL techniques using conventional slices. Besides, a new real-life fault in schedule2 of Siemens Suite is identified in our experiments.

KW - class imbalance

KW - metamorphic slices

KW - metamorphic testing

KW - spectrum-based fault localization

KW - test oracle

UR - https://www.scopus.com/pages/publications/84885626367

U2 - 10.1109/QSIC.2013.18

DO - 10.1109/QSIC.2013.18

M3 - 论文

AN - SCOPUS:84885626367

SP - 260

EP - 267

T2 - 13th International Conference on Quality Software, QSIC 2013

Y2 - 29 July 2013 through 30 July 2013

ER -

Impacts of test suite's class imbalance on spectrum-based fault localization techniques

Abstract

Conference

Keywords

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