Impact energy and retained dose uniformity in enhanced glow discharge plasma immersion ion implantation

  • Qiu Yuan Lu
  • , Liu He Li
  • , Jian Hui Li
  • , Ricky K.Y. Fu
  • , Paul K. Chu

Research output: Contribution to journalArticlepeer-review

Abstract

The implantation energy and retained dose uniformity in enhanced glow discharge plasma immersion ion implantation (EGD-PIII) is investigated numerically and experimentally. Depth profiles obtained from different samples processed by EGD-PIII and traditional PIII are compared. The retained doses under different pulse widths are calculated by integrating the area under the depth profiles. Our results indicate that the improvement in the impact energy and retained dose uniformity by this technique is remarkable.

Original languageEnglish
Article number061503
JournalApplied Physics Letters
Volume95
Issue number6
DOIs
StatePublished - 2009

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