TY - GEN
T1 - Illumination-normalized face recognition using Chromaticity Intrinsic Image
AU - Zhang, Wuming
AU - Zhao, Xi
AU - Huang, Di
AU - Morvan, Jean Marie
AU - Wang, Yunhong
AU - Chen, Liming
N1 - Publisher Copyright:
© 2015 IEEE.
PY - 2015/6/29
Y1 - 2015/6/29
N2 - Face recognition (FR) across illumination variations endeavors to alleviate the effect of illumination changes on human face, which remains a great challenge in reliable FR. Most prior studies focus on normalization of holistic lighting intensity while neglecting or simplifying the mechanism of image color formation. In contrast, we propose in this paper a novel approach for lighting robust FR through building the underlying reflectance model which characterizes the appearance of face surface. Specifically, the proposed illumination processing pipeline sheds light on interactions among face surface, lighting and camera, and enables generation of Chromaticity Intrinsic Image (CII) in a log space which is robust to illumination variations. Experimental results on CMU-PIE and ESRC face databases show the effectiveness of the proposed approach to deal with lighting variations in FR.
AB - Face recognition (FR) across illumination variations endeavors to alleviate the effect of illumination changes on human face, which remains a great challenge in reliable FR. Most prior studies focus on normalization of holistic lighting intensity while neglecting or simplifying the mechanism of image color formation. In contrast, we propose in this paper a novel approach for lighting robust FR through building the underlying reflectance model which characterizes the appearance of face surface. Specifically, the proposed illumination processing pipeline sheds light on interactions among face surface, lighting and camera, and enables generation of Chromaticity Intrinsic Image (CII) in a log space which is robust to illumination variations. Experimental results on CMU-PIE and ESRC face databases show the effectiveness of the proposed approach to deal with lighting variations in FR.
UR - https://www.scopus.com/pages/publications/84943229466
U2 - 10.1109/ICB.2015.7139050
DO - 10.1109/ICB.2015.7139050
M3 - 会议稿件
AN - SCOPUS:84943229466
T3 - Proceedings of 2015 International Conference on Biometrics, ICB 2015
SP - 185
EP - 192
BT - Proceedings of 2015 International Conference on Biometrics, ICB 2015
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 8th IAPR International Conference on Biometrics, ICB 2015
Y2 - 19 May 2015 through 22 May 2015
ER -