@inproceedings{da9fad8d5d544d46a657f44252456e43,
title = "Identification on counterfeit plastic encapsulated microcircuits",
abstract = "Counterfeit plastic encapsulated microcircuits (PEMs) generally have very obvious features. Identification on these obvious counterfeit features can effectively eliminate the use of counterfeit PEMs and enhance the reliability of system. This paper provides a list of different inspection techniques and some cases of counterfeit PEMs detection from the testing center.",
keywords = "Cases, Counterfeit detection, Inspection techniques, Plastic Electronic Microcircuits (PEMs)",
author = "Cheng Ma and Zhang, \{Su Juan\} and Zhengping Chen",
year = "2016",
language = "英语",
series = "Conference Proceedings of the 4th International Symposium on Project Management, ISPM 2016",
publisher = "Aussino Academic Publishing House",
pages = "451--456",
editor = "Cao, \{Xi Shen\} and Henry Zhang and Cheng, \{Chang Bo\}",
booktitle = "Conference Proceedings of the 4th International Symposium on Project Management, ISPM 2016",
note = "4th International Symposium on Project Management, ISPM 2016 ; Conference date: 09-07-2016 Through 10-07-2016",
}