Identification of hotspot technologies in the field of radiation diagnosis based on bibliometric analysis of global patents

  • Zhao Lian Ouyang
  • , Yu Bo Fan*
  • , Ping Zhou
  • , Wei Chen
  • , Ran Ran Du
  • , Hui Chi
  • *Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Objective: To reveal technological development and innovative capacity in the field of medical radiation diagnosis device based on bibliometric analysis of international patents. Methods: The study searched and retrieved international patents in the field of medical radiation diagnosis device from THOMSON INNOVATION DATABASE for quantitative analysis of patent distribution by country and by institutions with regard to number of patent, annual development, citation index and technological hotspots. Results: The number of global patent application in the field of medical radiation diagnosis kept decreasing, but the number of patents applied by China and Korea kept on the rise year by year. US, JAPAN, EUROPE and CHINA are main suppliers of medical radiation diagnosis patents. The top 10 institutions applied half of total medical radiation diagnosis patents in the world. The top 3 institutions, SIEMENS, PHILIPS and GE, applied nearly 30% (27.9%) of total medical radiation diagnosis patents in the world. FUJI FILM, TOSHIBA and OLYMPUS were considered to possess development potentials due to their high development index. Conclusion: The number of global radiation diagnosis patents keeps decreasing in the past decade, but CHINA has R&D and manufacturing potentials. Radiation diagnosis using X-rays, NMR diagnosis and radiation diagnosis using nuclear radiation are technical hotspots in the field of medical radiation diagnosis device.

Original languageEnglish
Title of host publicationProceedings - 2014 International Conference on Information Science, Electronics and Electrical Engineering, ISEEE 2014
EditorsXiaohong Jiang, Shaozi Li, Ying Dai, Yun Cheng
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages84-88
Number of pages5
ISBN (Electronic)9781479931965
DOIs
StatePublished - 5 Nov 2014
Event2014 International Conference on Information Science, Electronics and Electrical Engineering, ISEEE 2014 - Sapporo City, Hokkaido, Japan
Duration: 26 Apr 201428 Apr 2014

Publication series

NameProceedings - 2014 International Conference on Information Science, Electronics and Electrical Engineering, ISEEE 2014
Volume1

Conference

Conference2014 International Conference on Information Science, Electronics and Electrical Engineering, ISEEE 2014
Country/TerritoryJapan
CitySapporo City, Hokkaido
Period26/04/1428/04/14

Keywords

  • Bibliometric analysis
  • Patent analysis
  • Radiation diagnosis
  • Technological distribution

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