Abstract
Uniform and straight amorphous SiOx nanowires with a length of several micrometers and an average diameter of 100 nm were synthesized by directly heating GeSi alloy film substrate with high melting-point tungsten. Systematically comparative experiments suggest that both the tungsten and GeSi alloy film play an important role in the formation of straight amorphous SiOx nanowire. Through detailed morphological, structural and chemical characterizations using electron microscopy, the contact angle anisotropy mechanism is suggested for the growth of the straight SiOx nanowires.
| Original language | English |
|---|---|
| Pages (from-to) | 14354-14361 |
| Number of pages | 8 |
| Journal | Journal of Physical Chemistry C |
| Volume | 117 |
| Issue number | 27 |
| DOIs | |
| State | Published - 11 Jul 2013 |
| Externally published | Yes |
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