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High-quality GaAs/InSb core–shell nanowires grown by molecular-beam epitaxy

  • Ran Zhuo
  • , Haiyan Shi
  • , Donghai Li
  • , Xiyu Hou
  • , Yukun Yin
  • , Dong Pan*
  • , Jianhua Zhao
  • *Corresponding author for this work
  • CAS - Institute of Semiconductors
  • University of Chinese Academy of Sciences

Research output: Contribution to journal › Article › peer-review

Abstract

High-quality GaAs/InSb core–shell nanowires have garnered significant research interest owing to the exceptional properties of InSb, including its high electron mobility, strong spin–orbit coupling, and large g-factor, which are pivotal for advanced electronics and quantum technologies. Concurrently, GaAs/InSb core–shell nanowires have been extensively investigated due to their potential in realizing topological insulators and enabling dissipationless edge state transport, characteristics analogous to those sought in InAs/GaSb systems. However, the substantial lattice mismatch (∼14.6%) between GaAs and InSb poses considerable challenges in achieving high-quality heteroepitaxial shells. Detailed investigations into the growth, microstructure, and strain distribution within such systems remain limited. Here, we demonstrate the successful growth of high-quality GaAs/InSb core–shell nanowires via molecular-beam epitaxy, utilizing self-catalyzed pure zinc blende GaAs nanowire cores. Through systematic optimization, we identified that an InSb shell growth temperature of 390 °C and an Sb/In beam equivalent pressure ratio of 4.36 are crucial for obtaining smooth, continuous shells with uniform thickness. Advanced transmission electron microscopy analysis confirmed the epitaxial zinc-blende structures of both the core and shell, revealing a dislocation density of approximately 50 μm−1 in the InSb shell, notwithstanding the lattice mismatch. Cross-sectional strain mapping, conducted via geometric phase analysis, unveiled a ∼15% compressive strain at the GaAs/InSb interface, along with complex residual strain within the shell, attributed to the hexagonal nanowire geometry. Field-effect transistors fabricated with back-gated configurations exhibited n-type conduction, with a room-temperature carrier mobility of 50 cm2⋅V−1⋅s−1 and Ohmic behavior. Our work provides useful insights for the growth and optimization of other highly mismatched core–shell nanowires, thereby facilitating their integration into complex device architectures.

Original languageEnglish
Article number088101
JournalChinese Physics B
Volume35
Issue number8
DOIs
StatePublished - Aug 2026

Keywords

  • electrical properties
  • GaAs/InSb
  • microstructure and strain analysis
  • molecular-beam epitaxy
  • nanowires

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