Abstract
White light photoconductive atomic force microscopy (pc-AFM) was employed to evaluate nanoscale open circuit (Voc) at high light intensities (up to 200 sun) of three donor:acceptor blends comprising two widely studied polymers and one small molecule donor material. By varying the work function of electron extraction contacts, the Voc observed in nanoscale measurements reveals a unified dependence on the electrode work functions regardless of the blend materials; in line with earlier macroscopic measurements at 1 sun. At high light intensities, an agreement between the nanoscale and bulk Voc is observed. Nonetheless, light intensity dependent V oc measurements suggest that under high light intensities, the V oc obtained by pc-AFM exhibits contact-limited behavior.
| Original language | English |
|---|---|
| Pages (from-to) | 1766-1771 |
| Number of pages | 6 |
| Journal | Energy and Environmental Science |
| Volume | 6 |
| Issue number | 6 |
| DOIs | |
| State | Published - Jun 2013 |
| Externally published | Yes |
UN SDGs
This output contributes to the following UN Sustainable Development Goals (SDGs)
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SDG 7 Affordable and Clean Energy
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