Guest Editorial: Special Cluster on Measurement and Metrology Theory and Technologies for Future 6G Wireless

Zhengpeng Wang; Wei Fan; Xiaobang Shang; Lars Foged; Benoit Derat; Kun Li

doi:10.1109/LAWP.2025.3623256

Guest Editorial: Special Cluster on Measurement and Metrology Theory and Technologies for Future 6G Wireless

Zhengpeng Wang^*
, Wei Fan
, Xiaobang Shang
, Lars Foged
, Benoit Derat
, Kun Li

^*Corresponding author for this work

School of Electronic and Information Engineering

Southeast University, Nanjing
National Physical Laboratory
Microwave Vision Group
Rohde & Schwarz
The University of Electro-Communications

Research output: Contribution to journal › Editorial

Original language	English
Pages (from-to)	3876-3879
Number of pages	4
Journal	IEEE Antennas and Wireless Propagation Letters
Volume	24
Issue number	11
DOIs	https://doi.org/10.1109/LAWP.2025.3623256
State	Published - 2025

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10.1109/LAWP.2025.3623256

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title = "Guest Editorial: Special Cluster on Measurement and Metrology Theory and Technologies for Future 6G Wireless",

author = "Zhengpeng Wang and Wei Fan and Xiaobang Shang and Lars Foged and Benoit Derat and Kun Li",

year = "2025",

doi = "10.1109/LAWP.2025.3623256",

language = "英语",

volume = "24",

pages = "3876--3879",

journal = "IEEE Antennas and Wireless Propagation Letters",

issn = "1536-1225",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

number = "11",

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T2 - Special Cluster on Measurement and Metrology Theory and Technologies for Future 6G Wireless

AU - Wang, Zhengpeng

AU - Fan, Wei

AU - Shang, Xiaobang

AU - Foged, Lars

AU - Derat, Benoit

AU - Li, Kun

PY - 2025

Y1 - 2025

UR - https://www.scopus.com/pages/publications/105024136711

U2 - 10.1109/LAWP.2025.3623256

DO - 10.1109/LAWP.2025.3623256

M3 - 社论

AN - SCOPUS:105024136711

SN - 1536-1225

VL - 24

SP - 3876

EP - 3879

JO - IEEE Antennas and Wireless Propagation Letters

JF - IEEE Antennas and Wireless Propagation Letters

IS - 11

ER -

Guest Editorial: Special Cluster on Measurement and Metrology Theory and Technologies for Future 6G Wireless

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